GPR Series

High-Performance RF Probe (GS/SG)

The GPR Series RF Probes are engineered for precision on-wafer measurements from DC up to 67 GHz. Featuring durable coaxial tips and low insertion loss, they provide reliable electrical contact for GS, SG, and GSG configurations, ideal for characterization of RFICs, MMICs, and semiconductor devices.

Key Specifications

Frequency: DC to 67 GHz
Pitch: 100μm - 1250μm (Customizable)
Connector: 1.85mm / 2.92mm / 3.5mm
Configuration: GS, SG, GSG, GSSG

Datasheet

Consistent Contact. Reliable Data.

The GPR Series RF Probes are designed to meet the rigorous demands of on-wafer testing. With a robust coaxial design and precision-machined tips, they offer superior visibility for probe placement and consistent low-resistance contact on aluminum and gold pads.

Available in various pitches and configurations (GS, SG, GSG, etc.), these probes are essential tools for RFIC, MMIC, and device modeling applications.

Low Loss

Typical insertion loss < 0.5dB @ 40GHz.

High Repeatability

Durable beryllium copper tips ensure long life.

APPLICATIONS

On-Wafer RF MeasurementCharacterization of active and passive devices.
Device ModelingAccurate S-parameter extraction.
Production TestingHigh-throughput testing reliability.

Technical Specifications

Parameter	Value (Typical)
Frequency Range	DC to 40 / 50 / 67 GHz
Configuration	GS, SG, GSG, GSSG, SGS
Pitch	100, 125, 150, 200, 250 μm (Custom available)
Connector Type	2.92mm (K) / 2.4mm / 1.85mm (V) Female
Insertion Loss	< 0.8 dB @ 40GHz
Return Loss	> 15 dB @ 40GHz
Contact Resistance	< 0.05 Ω (Au Pad)
Tip Material	Beryllium Copper (BeCu) / Tungsten (W)
Body Material	Nickel Plated Aluminum