Application fit
On Wafer RF Probing
GPR Series RF Probe should be scoped around On-wafer RF probing, with voltage, power, interface, protection and acceptance requirements confirmed before quotation.
DC to 67 GHz< 1.3 dB @ 67 GHzGS / SG, 50-300 um
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GPR Series RF Probe
DC to 67 GHz RF Probe - GS/SG Wafer Probes for Repeatable On-Wafer RF Measurement
XGY GPR Series RF probes use 3D MEMS micromachining and nickel-alloy tips for stable, repeatable on-wafer contact from DC to 67 GHz. GS and SG configurations support 50 to 300 um pitch options for probe-station measurement setups.
Application fit
Match the product configuration to the engineering workflow before quotation.
Use the application fit, workflow and RFQ sections below to turn a product page into a practical engineering shortlist.
Application fit
GS SG Probe To VNA Measurement
GPR Series RF Probe should be scoped around GS/SG probe-to-VNA measurement, with voltage, power, interface, protection and acceptance requirements confirmed before quotation.
< 1.3 dB @ 67 GHzGS / SG, 50-300 umOn-wafer RF measurement
Application fit
Probe Station Measurement Integration
GPR Series RF Probe should be scoped around Probe-station measurement integration, with voltage, power, interface, protection and acceptance requirements confirmed before quotation.
GS / SG, 50-300 umOn-wafer RF measurementDC to 26 / 40 / 50 / 67 GHz
Application fit
Small Passivation Opening Contact
GPR Series RF Probe should be scoped around Small passivation opening contact, with voltage, power, interface, protection and acceptance requirements confirmed before quotation.
On-wafer RF measurementDC to 26 / 40 / 50 / 67 GHzDC to 67 GHz
Precision On-Wafer RF Measurement
The GPR Series RF probes deliver reliable, repeatable on-wafer contact from DC to 67 GHz. Available in multiple tip configurations and pitch sizes, they are the essential interconnect between your VNA and the device under test.
Key Technical Advantages
- Wide Bandwidth: DC to 67 GHz coverage supports on-wafer RF measurement
- Low Insertion Loss: model-listed insertion loss remains below 1.3 dB through the 67 GHz probe
- Durable Tips: Nickel alloy tip material for reliable contact on various pad metallizations
Typical Applications
- On-wafer RF probing - DC to 67 GHz with GS/SG tips
- Probe-to-VNA measurement - listed probe-cable application for compatible probe setups
- Small passivation opening contact - proprietary tip design helps reduce probe skating
- Probe-station integration - confirm module compatibility and mechanical constraints during selection
Key Advantages
- Frequency DC to 67 GHz
- Pitch 50 - 300 um
- Connector SMA / 2.92mm / 2.4mm / 1.85mm
- Configuration GS, SG
Performance Highlights
- Frequency DC to 67 GHz
- Insertion Loss < 1.3 dB @ 67 GHz
- Platform GS / SG, 50-300 um
- Best For On-wafer RF measurement
Looking for a custom probe station solution?
XGY Tek specializes in tailoring probe stations to meet specific semiconductor testing and characterization requirements.
Get a QuoteTechnical Resources
Fit check
Use this product when the requirement matches the published envelope.
Strong fit
- Projects centred on On-wafer RF probing
- Projects centred on GS/SG probe-to-VNA measurement
- Projects centred on Probe-station measurement integration
- Requirements that benefit from Frequency and Pitch
Review alternatives
- Requirements outside the published voltage, current, power or frequency envelope
- Projects without a defined DUT, site power, interface or acceptance method
- Simple bench work where a lower-cost standard supply would meet the requirement
- RFQs that cannot yet specify protection, cooling, cabling or control boundaries
Quote-stage checklist
The fastest way to make the enquiry useful.
Voltage rangeCurrent / powerOperating modeDUT typeLoad profileControl interfaceProtection needsCooling / installationCable / fixture planCompliance workflowLead timeFAT/SAT evidence
Add the operating profile, safety boundary, control interface and acceptance evidence expected by the buyer before requesting final configuration and lead time.
Quote workflow
Make the test plan visible before the quote is final.
A useful RFQ is a short engineering model: operating envelope, DUT workflow, control boundary and acceptance evidence.
Send RFQ01
Confirm the electrical envelope
Ratings mapStart with voltage, current, power, frequency, operating mode and site power limits before selecting a model.
02
Define the DUT workflow
Use-case briefMap the equipment to On-wafer RF probing; GS/SG probe-to-VNA measurement; Probe-station measurement integration and record any transient, cycling, compliance or automation needs.
03
Lock the acceptance package
Quote evidenceConfirm control interfaces, protection requirements, data logging, remote operation and the FAT/SAT evidence needed by the buyer.
Frequently Asked Questions
What should buyers know about GPR Series RF Probe?
This product page summarises GPR Series RF Probe within XGY Tek's Probe Stations catalogue. Review the published specifications and application notes to determine whether the product matches the intended workflow.
Which published specifications should buyers compare for GPR Series RF Probe?
Start with the values highlighted on this page: Frequency Range: DC to 26 / 40 / 50 / 67 GHz; Configuration: GS, SG; Pitch: 50 - 300 um; Connector Type: SMA / 2.92mm / 2.4mm / 1.85mm. Check whichever selection criteria apply, such as measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, accessories, and any stated test conditions. Not every criterion applies to every product.
How should GPR Series RF Probe be matched to an application?
Published applications include On-wafer RF probing; GS/SG probe-to-VNA measurement; Probe-station measurement integration; Small passivation opening contact. Use the application notes as selection guidance, then confirm the required operating conditions, interfaces, software compatibility, and accessories against the published specifications.
When should buyers compare another option in Probe Stations?
Compare alternatives when the published measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, or available accessories do not match the intended workflow. Confirm any critical value together with its stated conditions before selecting a configuration.
How can I request a quote or datasheet for GPR Series RF Probe?
Use the Get a Quote form to share the application, required configuration, interfaces, accessories, documentation needs, and timing. XGY Tek will review the request before confirming a suitable configuration. A downloadable datasheet is linked from the product page.Get a Quote
What support information is available for GPR Series RF Probe?
Support scope is confirmed during quotation. Ask about commissioning, software integration, calibration documentation, acceptance requirements, training, accessories, spares, and service arrangements relevant to the application.About XGY TekWhere to Buy
Looking for a custom probe station solution?
XGY Tek specializes in tailoring probe stations to meet specific semiconductor testing and characterization requirements.