Semiconductor
Semiconductor Test & Measurement Solutions for Australia
XGY Tek supplies precision test and measurement instruments used in semiconductor device characterization, wafer-level probing, and post-fabrication reliability testing. The core problem is aligning probe station mechanics, low-current measurement, RF cabling, thermal conditions, fixture safety, and acceptance records before wafer or device testing starts. The workflow is suited to foundries, fabless design houses, university research groups, and government laboratory projects across global markets. Calibration documentation and support scope are confirmed during quotation, with engineering support available in AEST/ACST hours.
Application focus
Use when spurious output, harmonics, EMI, or RF leakage can hide device issues. XGY spectrum analyzers help semiconductor teams validate packaged or wafer-level RF behavior with clearer evidence.
Spectrum Analyzer
High-performance spectrum analyzers for semiconductor testing
Application focus
Use when characterization depends on a clean, repeatable RF stimulus rather than a generic lab source. XGY signal generators support mixer, receiver, device, and validation benches with stable output.
Signal Generators
Precision signal generators for semiconductor characterization
Application focus
Use when wafer probing needs stable mechanics, reliable contact, and measurement-ready access. XGY probe stations support device I-V, RF probing, low-current work, and research lab characterization.
Probe Stations
Probe stations for wafer-level semiconductor testing
Application focus
Use when probe-station cabling or RF paths become the weak link in the measurement. XGY accessories improve VNA stability, LISN setup quality, shielding paths, and repeatable RF connections.
RF Accessories
RF cables, adapters, and accessories for test setups
Related Solutions
Explore how these products and workflows connect across broader test and measurement systems.
Selection Guides
Read buyer's guides to choose the right instrument or system for your application.
Frequently Asked Questions
What semiconductor measurements does XGY Tek support?
The semiconductor test workflow typically spans DC parametric measurement, RF and mmWave S-parameter characterization, signal-integrity validation, and EMC pre-compliance screening. To cover these stages we distribute and integrate handheld and benchtop spectrum analyzers (YSA-P400, YSA-N400, YSA-U090) for spurious and harmonic analysis up to 40 GHz; portable signal generators (YSG-P400, YSG-400B) and the YSG-140 low-phase-noise frequency source; vector network analyzers such as the YNA-3084 4-port PXIe VNA with >123 dB dynamic range; and manual probe stations like the XMPS-208. PXIe source measure units in our power supplies & SMU family deliver femtoampere-resolution current measurement.
Which applications and industries benefit most?
Typical applications include CMOS RF transistor characterization, GaN and SiC power-device parametric test, MMIC validation, antenna and packaging S-parameter sweeps, EMC pre-compliance (paired with our EM5040 LISN), and reliability burn-in monitoring. End markets include RF device research, automotive power electronics, photonic-integrated-circuit validation, and university semiconductor curricula.
Why choose XGY Tek as your semiconductor test partner?
XGY Tek (XGY Pty Ltd, ABN 70 688 984 590) is headquartered in Adelaide with a Sydney office. We provide pre-sales configuration assistance, on-site commissioning, calibration management, and direct technical support from local RF and instrumentation engineers. Custom PXIe rack builds and SCPI-driven test sequencing are available through our Custom Automation service line. For a tailored bill of materials, request a quote and an engineer will respond the same business day.