Probe Stations

Precision Semiconductor Test Systems

XGY probe stations provide the ultra-stable, wafer-level contact essential for rigorous semiconductor failure analysis and precise IC verification. Engineered with 0.5 μm manual XYZ alignment and thermal capabilities up to 300°C for wafers up to 8 inches, they establish a secure, particle-monitored probing environment required to confidently characterize sensitive die-level structures.