Australian Engineered

GPR Series

High-Performance RF Probe (DC-67 GHz)

The GPR Series RF Probes are engineered for precision on-wafer measurements from DC up to 67 GHz. Featuring durable coaxial tips and low insertion loss, they provide reliable electrical contact for GS, SG, and GSG configurations.

Frequency Range

DC to 40 / 50 / 67 GHz

Configuration

GS, SG, GSG, GSSG, SGS

Pitch

100 - 1250 um

Connector Type

2.92mm(K) / 2.4mm / 1.85mm(V)

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GPR Series

Precision On-Wafer RF Measurement

The GPR Series RF probes deliver reliable, repeatable on-wafer contact from DC to 67 GHz. Available in multiple tip configurations and pitch sizes, they are the essential interconnect between your VNA and the device under test.

Key Advantages

  • Wide Bandwidth: DC to 67 GHz coverage supports millimeter-wave and 5G device characterization
  • Low Insertion Loss: < 0.8 dB at 40 GHz ensures measurement accuracy
  • Durable Tips: BeCu and Tungsten tip options for various pad metallizations

Typical Applications

  • RFIC and MMIC on-wafer characterization
  • 5G and millimeter-wave device testing
  • Semiconductor failure analysis
  • VNA calibration and measurement

Key Advantages

  • Frequency DC to 67 GHz
  • Pitch 100um - 1250um (Customizable)
  • Connector 1.85mm / 2.92mm / 3.5mm
  • Configuration GS, SG, GSG, GSSG

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See the GPR Series in action. Our engineers provide 1-on-1 consultations for your specific testing needs.

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Core Specifications

Parameter Value
Frequency Range DC to 40 / 50 / 67 GHz
Configuration GS, SG, GSG, GSSG, SGS
Pitch 100 - 1250 um
Connector Type 2.92mm(K) / 2.4mm / 1.85mm(V)
Insertion Loss < 0.8 dB @ 40GHz
Return Loss > 15 dB @ 40GHz
Contact Resistance < 0.05 Ohm on Au

Looking for a custom RF solution?

XGY Tek specializes in tailoring instrument hardware and software to meet specific aerospace, defense, and laboratory requirements.