XMPS-208
Manual Probe Station
XGY XMPS-208 is a high-performance manual probe station with 8-inch wafer capability, supporting temperatures up to 300°C. Equipped with particle counter and safety shield for semiconductor failure analysis and IC verification.
Key Advantages
Wafer Size
8-inch wafer support
Temperature
Up to 300°C
Safety
Integrated safety shield
Cleanroom
Built-in particle counter
Precision
Manual XYZ alignment
Application
Failure analysis, IC verification
Core Specifications
Wafer Size
8 inch
Temp Range
Up to 300°C
Stage Type
Manual XYZ
Safety
Shield included
High Performance Manual Probe Station
The XGY XMPS-208 is designed for semiconductor failure analysis and IC verification with 8-inch wafer capability and high temperature support up to 300°C.
Looking for a custom probe station solution?
XGY Tek specializes in tailoring probe stations to meet specific semiconductor testing and characterization requirements.