Measurement capability
350 to 1200 nm Measurement
A single instrument connects visible and near-infrared source and component workflows.
350 to 1200 nm visible and near-infrared optical spectrum analysis, with 0.01 nm resolution available from 400 to 470 nm
The XGY XOA-1200 is a grating-based optical spectrum analyzer for visible-to-near-infrared measurement from 350 to 1200 nm. It combines band-qualified high resolution, conditioned weak-signal sensitivity, fiber coupling, optical-axis alignment, and integrated spectrum analysis for lasers, LEDs, passive components, and short-wavelength photonics.
Compare wavelength coverage, finest applicable resolution and conditioned sensitivity before reviewing the complete source-backed specification table.
350 to 1200 nm
0.01 nm at 400 to 470 nm
-80 dBm under stated conditions
Application and capability fit
Use wavelength range, resolution, sensitivity, dynamic-range conditions, input coupling and analysis workflow together. A headline value should not be extended beyond its published model, wavelength interval or test condition.
Measurement capability
A single instrument connects visible and near-infrared source and component workflows.
Measurement capability
Use the 0.01 nm setting only within its published 400 to 470 nm wavelength interval.
Measurement capability
Published accuracy is tied to calibration with a 633 nm He-Ne laser and to the stated wavelength intervals.
Measurement capability
NORMAL, MID, HIGH1, HIGH2, and HIGH3 support different speed and low-level measurement requirements.
Measurement capability
The 60 dB value is qualified by wavelength, resolution, and peak-offset conditions rather than presented as a full-range figure.
Measurement capability
Fiber compatibility extends from single-mode and common graded-index fibers to large-core fiber up to 800 µm.
Measurement capability
A built-in alignment source supports optical-axis adjustment during setup.
Measurement capability
Integrated spectrum and visible colour analysis streamline source and component characterization.
The XOA-1200 Optical Spectrum Analyzer measures optical power as a function of wavelength from 350 to 1200 nm. Its coverage supports short-wavelength lasers, LEDs, passive optical components, biomedical optics, material processing, and consumer or healthcare photonics.
Published performance is interval- and setting-dependent. The 0.01 nm resolution setting is available only from 400 to 470 nm. Across the full wavelength range, selectable resolution settings begin at 0.02 nm and extend to 10 nm.
| Parameter | Published performance |
|---|---|
| Wavelength range | 350 to 1200 nm |
| Scan span | 0.5 to 850 nm including full range; 0 nm |
| Wavelength resolution | 0.02, 0.05, 0.1, 0.2, 0.5, 1, 2, 5, and 10 nm over the full range |
| Band-limited finest resolution | 0.01 nm from 400 to 470 nm |
| Wavelength accuracy | ±0.05 nm at 633 nm; ±0.2 nm from 400 to 1100 nm after calibration with a 633 nm He-Ne laser |
| Minimum sampling resolution | 0.001 nm |
| Sample points | 101 to 50,001 plus AUTO |
The full wavelength range is broader than the interval covered by the published ±0.2 nm accuracy figure. No additional accuracy value is inferred for 350 to 400 nm or 1100 to 1200 nm.
| Wavelength interval | Published sensitivity in HIGH3 | Published maximum safe input |
|---|---|---|
| 350 to 400 nm | Not specified | Not specified |
| 400 to 500 nm | -60 dBm | +10 dBm from 400 to 550 nm |
| 500 to 1000 nm | -80 dBm | +10 dBm to 550 nm, then +20 dBm from 550 nm |
| 1000 to 1100 nm | -60 dBm | +20 dBm |
| 1100 to 1200 nm | Not specified | Not specified |
Sensitivity values require resolution of at least 0.2 nm, 10 averages, and HIGH3. The safe-input values are total input-power limits. Unspecified edge intervals are not treated as zero and are not extrapolated from adjacent bands.
These are conditioned values, not full-range guarantees.
The FC optical input supports single-mode fiber, GI 50/125 µm, GI 62.5/125 µm, and large-core fiber up to 800 µm. The built-in alignment source supports optical-axis adjustment. Five sensitivity modes trade scan time against low-level performance: NORMAL 1 s, MID 2 s, HIGH1 5 s, HIGH2 20 s, and HIGH3 75 s.
The 12.1-inch touch interface provides multi-application spectrum analysis and visible colour analysis for source and component development, validation, and repeated measurement.
The published XOA-1200 specifications do not state mechanical dimensions, mass, mains-power requirements, environmental limits, warranty terms, or detailed remote-control interfaces. Include those requirements, the desired optical interface, calibration documentation, and the target wavelength/power range in the quote request.
Send the wavelength band, source or device type, expected optical power, required resolution, coupling method and acceptance requirements for configuration review.
Get a Quote| Parameter | Specification |
|---|---|
| Model | XOA-1200 |
| Measurement Architecture | Diffraction-grating optical spectrum analysis |
| Wavelength Range | 350 to 1200 nm |
| Scan Span | 0.5 to 850 nm including full range; 0 nm |
| Wavelength Resolution Settings | 0.02, 0.05, 0.1, 0.2, 0.5, 1, 2, 5, and 10 nm over the full range; 0.01 nm from 400 to 470 nm |
| Wavelength Accuracy | ±0.05 nm at 633 nm; ±0.2 nm from 400 to 1100 nm Condition: After wavelength calibration with a 633 nm He-Ne laser |
| Minimum Sampling Interval | 0.001 nm |
| Sample Points | 101 to 50,001 plus AUTO |
| Sensitivity Settings | NORMAL, MID, HIGH1, HIGH2, and HIGH3 |
| Sensitivity | -80 dBm from 500 to 1000 nm; -60 dBm from 400 to 500 nm and from 1000 to 1100 nm Condition: Resolution ≥0.2 nm, 10 averages, HIGH3 |
| Sensitivity Outside Published Bands | No published value is stated from 350 to 400 nm or from 1100 to 1200 nm |
| Maximum Safe Input Power | +20 dBm from 550 to 1100 nm; +10 dBm from 400 to 550 nm Condition: Total input power |
| Safe Input at Range Edges | Not specified from 350 to 400 nm or from 1100 to 1200 nm |
| Power Accuracy | ±1.0 dB Condition: 850 nm, -20 dBm input, resolution ≥0.2 nm, MID or HIGH1 to HIGH3, SMF MFD 5 µm at 850 nm and NA 0.14 |
| Power Linearity | ±0.2 dB from -40 to 0 dBm input Condition: HIGH1 to HIGH3 |
| Dynamic Range | 60 dB Condition: 633 nm, peak ±0.5 nm, 0.02 nm resolution |
| Optical Connector | FC type for optical input and calibration output |
| Scan Time | NORMAL: 1 s; MID: 2 s; HIGH1: 5 s; HIGH2: 20 s; HIGH3: 75 s |
| Supported Fibers | SM; GI 50/125 µm; GI 62.5/125 µm; large-core fiber up to 800 µm |
| Built-In Light Source | Optical-axis alignment source for alignment adjustment; no wavelength-reference source required |
| Display | 12.1-inch touch display |
* Specifications are subject to change without notice. Contact XGY Tek for full technical datasheet.
Fit check
Quote-stage checklist
Include any wavelength-specific accuracy, sensitivity or dynamic-range condition that must be demonstrated during acceptance testing.
Optical analyzer selection workflow
A useful optical spectrum analyzer RFQ defines the measurement window, optical-power envelope, coupling method and evidence required from the finished setup.
Send optical analyzer RFQConfirm the source wavelength, required span, line separation and sampling requirement against the selected model's published range.
Match expected optical power, sensitivity mode, averaging, dynamic-range condition and safe-input limit to the real measurement.
Confirm free-space or fibre input, connector and fibre type, calibration method, analysis functions, remote-control needs and acceptance records.
This product page summarises XOA-1200 Optical Spectrum Analyzer within XGY Tek's Optical Spectrum Analyzers catalogue. Review the published specifications and application notes to determine whether the product matches the intended workflow.
Start with the values highlighted on this page: Model: XOA-1200; Measurement Architecture: Diffraction-grating optical spectrum analysis; Wavelength Range: 350 to 1200 nm; Scan Span: 0.5 to 850 nm including full range; 0 nm. Check whichever selection criteria apply, such as measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, accessories, and any stated test conditions. Not every criterion applies to every product.
Published applications include Short-wavelength laser development and manufacturing; Visible and near-infrared LED characterization; Passive optical component development and production; Biomedical optical-device and system work; Material-processing source and component evaluation. Use the application notes as selection guidance, then confirm the required operating conditions, interfaces, software compatibility, and accessories against the published specifications.
Compare alternatives when the published measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, or available accessories do not match the intended workflow. Confirm any critical value together with its stated conditions before selecting a configuration.
Use the Get a Quote form to share the application, required configuration, interfaces, accessories, documentation needs, and timing. XGY Tek will review the request before confirming a suitable configuration. A downloadable datasheet is linked from the product page.Get a Quote
Support scope is confirmed during quotation. Ask about commissioning, software integration, calibration documentation, acceptance requirements, training, accessories, spares, and service arrangements relevant to the application.About XGY TekWhere to Buy
Send the wavelength band, source or device type, expected optical power, required resolution, coupling method and acceptance requirements for configuration review.