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XGY Datasheet

XOA-1200 Optical Spectrum Analyzer

350 to 1200 nm visible and near-infrared optical spectrum analysis, with 0.01 nm resolution available from 400 to 470 nm

The XGY XOA-1200 is a grating-based optical spectrum analyzer for visible-to-near-infrared measurement from 350 to 1200 nm. It combines band-qualified high resolution, conditioned weak-signal sensitivity, fiber coupling, optical-axis alignment, and integrated spectrum analysis for lasers, LEDs, passive components, and short-wavelength photonics.

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XOA-1200 Optical Spectrum Analyzer

Core Specifications

Compare wavelength coverage, finest applicable resolution and conditioned sensitivity before reviewing the complete source-backed specification table.

WAVELENGTH

350 to 1200 nm

FINEST RESOLUTION

0.01 nm at 400 to 470 nm

SENSITIVITY

-80 dBm under stated conditions

Application and capability fit

Match the optical measurement window before selecting a model.

Use wavelength range, resolution, sensitivity, dynamic-range conditions, input coupling and analysis workflow together. A headline value should not be extended beyond its published model, wavelength interval or test condition.

Measurement capability

350 to 1200 nm Measurement

A single instrument connects visible and near-infrared source and component workflows.

Measurement capability

Band-Limited 0.01 nm Setting

Use the 0.01 nm setting only within its published 400 to 470 nm wavelength interval.

Measurement capability

Calibrated Wavelength Performance

Published accuracy is tied to calibration with a 633 nm He-Ne laser and to the stated wavelength intervals.

Measurement capability

Five Sensitivity Settings

NORMAL, MID, HIGH1, HIGH2, and HIGH3 support different speed and low-level measurement requirements.

Measurement capability

Conditioned Dynamic Range

The 60 dB value is qualified by wavelength, resolution, and peak-offset conditions rather than presented as a full-range figure.

Measurement capability

Large-Core Fiber Support

Fiber compatibility extends from single-mode and common graded-index fibers to large-core fiber up to 800 µm.

Measurement capability

Optical-Axis Alignment

A built-in alignment source supports optical-axis adjustment during setup.

Measurement capability

Touch-Driven Analysis

Integrated spectrum and visible colour analysis streamline source and component characterization.

Visible-to-Near-Infrared Optical Spectrum Analysis

The XOA-1200 Optical Spectrum Analyzer measures optical power as a function of wavelength from 350 to 1200 nm. Its coverage supports short-wavelength lasers, LEDs, passive optical components, biomedical optics, material processing, and consumer or healthcare photonics.

Published performance is interval- and setting-dependent. The 0.01 nm resolution setting is available only from 400 to 470 nm. Across the full wavelength range, selectable resolution settings begin at 0.02 nm and extend to 10 nm.

Wavelength, Resolution, and Sampling

ParameterPublished performance
Wavelength range350 to 1200 nm
Scan span0.5 to 850 nm including full range; 0 nm
Wavelength resolution0.02, 0.05, 0.1, 0.2, 0.5, 1, 2, 5, and 10 nm over the full range
Band-limited finest resolution0.01 nm from 400 to 470 nm
Wavelength accuracy±0.05 nm at 633 nm; ±0.2 nm from 400 to 1100 nm after calibration with a 633 nm He-Ne laser
Minimum sampling resolution0.001 nm
Sample points101 to 50,001 plus AUTO

The full wavelength range is broader than the interval covered by the published ±0.2 nm accuracy figure. No additional accuracy value is inferred for 350 to 400 nm or 1100 to 1200 nm.

Sensitivity and Input Limits

Wavelength intervalPublished sensitivity in HIGH3Published maximum safe input
350 to 400 nmNot specifiedNot specified
400 to 500 nm-60 dBm+10 dBm from 400 to 550 nm
500 to 1000 nm-80 dBm+10 dBm to 550 nm, then +20 dBm from 550 nm
1000 to 1100 nm-60 dBm+20 dBm
1100 to 1200 nmNot specifiedNot specified

Sensitivity values require resolution of at least 0.2 nm, 10 averages, and HIGH3. The safe-input values are total input-power limits. Unspecified edge intervals are not treated as zero and are not extrapolated from adjacent bands.

Power and Dynamic-Range Conditions

  • Power accuracy: ±1.0 dB at 850 nm and -20 dBm input, with resolution of at least 0.2 nm, MID or HIGH1 to HIGH3, and the stated single-mode fiber conditions.
  • Power linearity: ±0.2 dB from -40 to 0 dBm input in HIGH1 to HIGH3.
  • Dynamic range: 60 dB at 633 nm, 0.02 nm resolution, and ±0.5 nm from the spectral peak.

These are conditioned values, not full-range guarantees.

Optical Input and Measurement Workflow

The FC optical input supports single-mode fiber, GI 50/125 µm, GI 62.5/125 µm, and large-core fiber up to 800 µm. The built-in alignment source supports optical-axis adjustment. Five sensitivity modes trade scan time against low-level performance: NORMAL 1 s, MID 2 s, HIGH1 5 s, HIGH2 20 s, and HIGH3 75 s.

The 12.1-inch touch interface provides multi-application spectrum analysis and visible colour analysis for source and component development, validation, and repeated measurement.

Scope to Confirm During Quotation

The published XOA-1200 specifications do not state mechanical dimensions, mass, mains-power requirements, environmental limits, warranty terms, or detailed remote-control interfaces. Include those requirements, the desired optical interface, calibration documentation, and the target wavelength/power range in the quote request.

Key Advantages

  • Visible-to-NIR Coverage Measure optical spectra from 350 to 1200 nm for short-wavelength sources, components, and systems.
  • 10 pm Resolution in a Defined Band A 0.01 nm resolution setting is available specifically from 400 to 470 nm; full-range settings start at 0.02 nm.
  • Conditioned Sensitivity to -80 dBm The -80 dBm figure applies from 500 to 1000 nm at resolution of at least 0.2 nm, 10 averages, and HIGH3.
  • 60 dB Dynamic Range Specified at 633 nm, 0.02 nm resolution, and an offset of ±0.5 nm from the spectral peak.
  • Flexible Fiber Coupling Supports single-mode, 50/125 µm and 62.5/125 µm graded-index, and large-core fibers up to 800 µm.
  • Integrated Analysis A 12.1-inch touch interface supports multi-application spectrum analysis and visible colour analysis.

Performance Highlights

  • Wavelength 350 to 1200 nm
  • Finest Resolution 0.01 nm from 400 to 470 nm
  • Sensitivity -80 dBm from 500 to 1000 nm under stated conditions
  • Dynamic Range 60 dB at 633 nm under stated conditions

Looking for a custom optical spectrum analyzer solution?

Send the wavelength band, source or device type, expected optical power, required resolution, coupling method and acceptance requirements for configuration review.

Get a Quote

Product Specifications

Parameter Specification
Model XOA-1200
Measurement Architecture Diffraction-grating optical spectrum analysis
Wavelength Range 350 to 1200 nm
Scan Span 0.5 to 850 nm including full range; 0 nm
Wavelength Resolution Settings 0.02, 0.05, 0.1, 0.2, 0.5, 1, 2, 5, and 10 nm over the full range; 0.01 nm from 400 to 470 nm
Wavelength Accuracy ±0.05 nm at 633 nm; ±0.2 nm from 400 to 1100 nm Condition: After wavelength calibration with a 633 nm He-Ne laser
Minimum Sampling Interval 0.001 nm
Sample Points 101 to 50,001 plus AUTO
Sensitivity Settings NORMAL, MID, HIGH1, HIGH2, and HIGH3
Sensitivity -80 dBm from 500 to 1000 nm; -60 dBm from 400 to 500 nm and from 1000 to 1100 nm Condition: Resolution ≥0.2 nm, 10 averages, HIGH3
Sensitivity Outside Published Bands No published value is stated from 350 to 400 nm or from 1100 to 1200 nm
Maximum Safe Input Power +20 dBm from 550 to 1100 nm; +10 dBm from 400 to 550 nm Condition: Total input power
Safe Input at Range Edges Not specified from 350 to 400 nm or from 1100 to 1200 nm
Power Accuracy ±1.0 dB Condition: 850 nm, -20 dBm input, resolution ≥0.2 nm, MID or HIGH1 to HIGH3, SMF MFD 5 µm at 850 nm and NA 0.14
Power Linearity ±0.2 dB from -40 to 0 dBm input Condition: HIGH1 to HIGH3
Dynamic Range 60 dB Condition: 633 nm, peak ±0.5 nm, 0.02 nm resolution
Optical Connector FC type for optical input and calibration output
Scan Time NORMAL: 1 s; MID: 2 s; HIGH1: 5 s; HIGH2: 20 s; HIGH3: 75 s
Supported Fibers SM; GI 50/125 µm; GI 62.5/125 µm; large-core fiber up to 800 µm
Built-In Light Source Optical-axis alignment source for alignment adjustment; no wavelength-reference source required
Display 12.1-inch touch display

* Specifications are subject to change without notice. Contact XGY Tek for full technical datasheet.

Technical Resources

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Pre-filled product inquiry

Fit check

Use this model when its published optical window contains the complete measurement.

Strong fit

  • Projects focused on Short-wavelength laser development and manufacturing
  • Projects focused on Visible and near-infrared LED characterization
  • Projects focused on Passive optical component development and production
  • Projects focused on Biomedical optical-device and system work
  • Projects focused on Material-processing source and component evaluation
  • Projects focused on Consumer and healthcare photonics

Review alternatives

  • Wavelengths outside the selected model's published measurement range
  • Resolution, sensitivity or dynamic-range requirements outside the stated test conditions
  • Input-power levels or fibre configurations that have not been checked against the published limits
  • Projects without a defined source, device, wavelength window or acceptance method

Quote-stage checklist

Optical spectrum analyzer RFQ checklist

Wavelength range and scan spanRequired resolution and sampling intervalExpected optical-power rangeSensitivity and dynamic-range targetFree-space or fibre inputConnector and fibre typeCalibration and alignment methodAnalysis and storage workflowRemote-control interfacesRequired acceptance documentation

Include any wavelength-specific accuracy, sensitivity or dynamic-range condition that must be demonstrated during acceptance testing.

Optical analyzer selection workflow

Turn the source and device requirements into a traceable configuration.

A useful optical spectrum analyzer RFQ defines the measurement window, optical-power envelope, coupling method and evidence required from the finished setup.

Send optical analyzer RFQ
01

Set wavelength and resolution

Range and resolution map

Confirm the source wavelength, required span, line separation and sampling requirement against the selected model's published range.

02

Check sensitivity and input limits

Optical-power envelope

Match expected optical power, sensitivity mode, averaging, dynamic-range condition and safe-input limit to the real measurement.

03

Lock coupling and acceptance evidence

Configuration checklist

Confirm free-space or fibre input, connector and fibre type, calibration method, analysis functions, remote-control needs and acceptance records.

Frequently Asked Questions

What should buyers know about XOA-1200 Optical Spectrum Analyzer?

This product page summarises XOA-1200 Optical Spectrum Analyzer within XGY Tek's Optical Spectrum Analyzers catalogue. Review the published specifications and application notes to determine whether the product matches the intended workflow.

Which published specifications should buyers compare for XOA-1200 Optical Spectrum Analyzer?

Start with the values highlighted on this page: Model: XOA-1200; Measurement Architecture: Diffraction-grating optical spectrum analysis; Wavelength Range: 350 to 1200 nm; Scan Span: 0.5 to 850 nm including full range; 0 nm. Check whichever selection criteria apply, such as measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, accessories, and any stated test conditions. Not every criterion applies to every product.

How should XOA-1200 Optical Spectrum Analyzer be matched to an application?

Published applications include Short-wavelength laser development and manufacturing; Visible and near-infrared LED characterization; Passive optical component development and production; Biomedical optical-device and system work; Material-processing source and component evaluation. Use the application notes as selection guidance, then confirm the required operating conditions, interfaces, software compatibility, and accessories against the published specifications.

When should buyers compare another option in Optical Spectrum Analyzers?

Compare alternatives when the published measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, or available accessories do not match the intended workflow. Confirm any critical value together with its stated conditions before selecting a configuration.

How can I request a quote or datasheet for XOA-1200 Optical Spectrum Analyzer?

Use the Get a Quote form to share the application, required configuration, interfaces, accessories, documentation needs, and timing. XGY Tek will review the request before confirming a suitable configuration. A downloadable datasheet is linked from the product page.Get a Quote

What support information is available for XOA-1200 Optical Spectrum Analyzer?

Support scope is confirmed during quotation. Ask about commissioning, software integration, calibration documentation, acceptance requirements, training, accessories, spares, and service arrangements relevant to the application.About XGY TekWhere to Buy

Looking for a custom optical spectrum analyzer solution?

Send the wavelength band, source or device type, expected optical power, required resolution, coupling method and acceptance requirements for configuration review.