XOA-1700-R20 / XOA-1700-R10 Optical Spectrum Analyzers

High-Resolution Optical Spectrum Analysis from 600 to 1700 nm

The XOA-1700 Series measures optical power as a function of wavelength across 600 to 1700 nm. It is intended for optical communications, active and passive photonic devices, component production, and laboratory characterization. Selectable wavelength resolution, five sensitivity settings, fiber and free-space input, and application-specific analysis tools allow the same platform to move between weak-signal inspection and higher-power component testing.

Both models share the published 600 to 1700 nm wavelength range, sensitivity limits, +20 dBm per-channel input limit, +25 dBm total safe-input limit, 35 dB optical return loss with an APC connector, supported fiber types, and free-space optical input. Their main documented differences are resolution, zero-span capability, sample-point capacity, wavelength performance, and model-specific dynamic-range values.

XOA-1700-R20 and XOA-1700-R10 Model Comparison

Parameter	XOA-1700-R20	XOA-1700-R10
Wavelength range	600 to 1700 nm	600 to 1700 nm
Scan span	0.2 to 1100 nm, including full range	0 nm plus 0.2 to 1100 nm, including full range
Wavelength resolution settings	0.02, 0.05, 0.1, 0.2, 0.5, 1, and 2 nm	0.01, 0.02, 0.05, 0.1, 0.2, 0.5, 1, and 2 nm
Wavelength accuracy at 1520 to 1620 nm	±0.02 nm	±0.01 nm
Wavelength accuracy at 1450 to 1520 nm	±0.04 nm	±0.04 nm
Full-range wavelength accuracy	±0.10 nm	±0.10 nm
Wavelength linearity at 1520 to 1580 nm	±0.015 nm	±0.01 nm
Wavelength repeatability	±0.005 nm over 1 minute	±0.005 nm over 2 minutes
Minimum sampling resolution	0.001 nm	0.001 nm
Sample points	101 to 50,001 plus AUTO	101 to 100,001 plus AUTO
Sensitivity settings	NORMAL, MID, HIGH1, HIGH2, and HIGH3	NORMAL, MID, HIGH1, HIGH2, and HIGH3
Stray-light suppression	76 dB	80 dB

Choose XOA-1700-R20 when 20 pm minimum selectable resolution and up to 50,001 points meet the measurement plan. Choose XOA-1700-R10 when the DUT requires a 10 pm minimum selectable resolution, a 0 nm span setting, or up to 100,001 sample points.

Sensitivity and Power Performance

Parameter	Published performance
Sensitivity, 1300 to 1620 nm	-90 dBm in HIGH3
Sensitivity, 1000 to 1300 nm	-85 dBm in HIGH3
Sensitivity, 600 to 1000 nm	-60 dBm in HIGH3
Maximum input power	+20 dBm per channel across the full wavelength range
Maximum safe input	+25 dBm total input power
Power accuracy	±0.4 dB at 1310 or 1550 nm, -20 dBm input, MID sensitivity
Power linearity	±0.05 dB from -50 to +10 dBm input
Power flatness	±0.1 dB from 1520 to 1580 nm; ±0.2 dB from 1450 to 1520 nm and 1580 to 1620 nm

The published sensitivity coverage ends at 1620 nm even though the instrument wavelength range extends to 1700 nm. No sensitivity value is claimed here for 1620 to 1700 nm.

Published Dynamic Range by Model and Resolution

Dynamic range depends on both wavelength resolution and distance from the spectral peak. The available guaranteed values are:

Resolution and offset	XOA-1700-R20	XOA-1700-R10
0.01 nm, ±1.0 nm from peak	Not applicable because XOA-1700-R20 does not provide 0.01 nm resolution	80 dB
0.02 nm, ±0.2 nm / ±0.1 nm from peak	52 dB / 32 dB	No published value is stated
0.05 nm, ±1.0 nm / ±0.4 nm / ±0.2 nm from peak	73 dB / 58 dB / 45 dB	No published value is stated
0.1 nm, ±0.4 nm / ±0.2 nm from peak	55 dB / 40 dB	No published value is stated

The absence of published XOA-1700-R10 values at 0.02, 0.05, and 0.1 nm does not mean zero performance. Those conditions remain unclaimed until model-specific released data is available.

Polarization Dependence

At 1550 nm, the published value is ±0.08 dB for both models; the XOA-1700-R20 value is specified with wavelength resolution of at least 0.05 nm. At 1310 nm, XOA-1700-R20 is specified at ±0.08 dB. No published XOA-1700-R10 value is stated at 1310 nm, so none is inferred.

Integrated Analysis Workflows

• Adaptive spectral peak search: automatically locates peaks across complex laser and multiplexed spectra.
• Single-longitudinal-mode laser analysis: threshold and side-mode suppression ratio analysis evaluate centre wavelength, spectral bandwidth, and SMSR for DFB-LD and related sources.
• Multimode laser analysis: n-dB loss, envelope, and RMS methods provide complementary centre-wavelength and bandwidth measurements for FP-LD and related sources.
• One-touch and batch processing: application workflows support LED, FP-LD, DFB-LD, and LD-module testing with batch processing of selected measurement items.

Optical Input and Applications

The optical input supports SM 9.5/125 µm, GI 50/125 µm, GI 62.5/125 µm, and large-core fiber up to 200 µm. Free-space optical input extends the platform to devices and optical paths that are not conveniently fiber-coupled.

Typical applications include DWDM and WDM channel-spectrum inspection, WDM filter and fiber-amplifier evaluation, optical amplifier characterization, DFB-LD and FP-LD testing, LED and optical-transceiver analysis, optical-fiber and fiber-grating measurement, polarization-mode-dispersion work, and repeatable optical-chip or optoelectronic-system characterization.

XOA-1700 Platform Details and Options

The detailed chassis and option data is published specifically for the XOA-1700-R20 configuration. It lists a 12.1-inch touch screen, 128 GB storage, USB and Ethernet, VGA availability by configuration, 100-240 VAC at 50/60 Hz, maximum power consumption of 100 W, operation from 5-35 °C at up to 80% RH, and a performance-guarantee temperature of 18-28 °C. The published chassis size is (426 ±4) × (221 ±2.5) × (450 ±4) mm W × H × D, with an approximate weight of 20 kg.

Available configurations should be confirmed during quotation:

• Built-in SLED source option: at least 1 mW output and 1550 nm centre wavelength.
• SLED source with C2H2 absorption cell: at least 1 mW output and 1550 nm centre wavelength.
• GPIB and trigger I/O option: GPIB interface, trigger input, and trigger output.
• English interface configuration: English-language front and rear panels with an English operating system.

Allow at least one hour of warm-up and perform internal-source calibration after warm-up. An external optical source may also be used for wavelength calibration and optical-axis alignment. The detailed chassis, environmental, interface, and option values above are not independently stated for XOA-1700-R10; availability is confirmed during quotation.