Optical Spectrum Analyzers
XOA-2400 / XOA-2500 Series Optical Spectrum Analyzers
Extended-NIR and SWIR Optical Spectrum Analysis
XOA-2400 covers 1200–2400 nm and XOA-2500 covers 1000–2500 nm. Both are grating-based optical spectrum analyzers with standard 0.05–2 nm resolution settings for telecom, extended-NIR and SWIR tests.
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- Wavelength range
- XOA-2400: 1200 to 2400 nm; XOA-2500: 1000 to 2500 nm
- By model
- Wavelength resolution settings
- 0.05, 0.1, 0.2, 0.5, 1, and 2 nm
- Sensitivity
- -65 dBm from 1800 to 2200 nm
- HIGH3
- Dynamic range
- 50 dB at ±0.8 nm peak offset
- 1523 nm, 0.05 nm resolution, HIGH1 to HIGH3
Overview
XOA-2400 covers 1200–2400 nm and XOA-2500 covers 1000–2500 nm. Both are grating-based optical spectrum analyzers with standard 0.05–2 nm resolution settings for telecom, extended-NIR and SWIR tests.
Additional product details
XOA-2400 covers 1200 to 2400 nm; XOA-2500 extends coverage to 1000 to 2500 nm.
The XOA-2400 / XOA-2500 12.1-inch touch interface and integrated analysis functions support LED, FP-LD, DFB-LD, optical-transceiver, DWDM, amplifier, fiber, grating, SWIR, sensing, and medical measurement workflows. On the XOA-2400 / XOA-2500 Series, a 0.002 nm minimum sampling interval and up to 50,001 points support detailed spectral capture, and free-space input and support for single-mode, graded-index, and large-core fibers accommodate diverse optical paths. The XOA-2400 / XOA-2500 Series also measures optical fiber, fiber gratings, and other passive optical components across the applicable model range.
Both XOA-2400 / XOA-2500 models have a 50 pm minimum standard setting: both models provide 0.05, 0.1, 0.2, 0.5, 1, and 2 nm resolution settings in the standard configuration. The XOA-2400 / XOA-2500 0.05 nm minimum standard resolution is the smallest of six standard resolution settings from 0.05 to 2 nm that both models share.
External-source calibration and optical-axis alignment on the XOA-2400 / XOA-2500 Series are supported when the gas-absorption-cell calibration-source option is not fitted. Specifications do not establish that calibration source as standard equipment.
Key Capabilities & Applications
Model-selected wavelength window
Choose 2400 or 2500 for the required spectral edges. Both provide 0.002 nm minimum sampling interval and 101–50,001 points plus AUTO.
Conditioned optical performance
HIGH3 sensitivity is −65 dBm at 1800–2200 nm, with separate neighboring-band limits. Wavelength accuracy is ±0.05 nm at 1520–1580 nm and ±0.50 nm across the selected model's full range.
Flexible input and calibration
Free-space input and single-mode, graded-index and large-core fibers up to 200 µm are supported. External-source calibration/alignment applies when the gas-absorption-cell calibration-source option is not fitted.
Common applications
- Optical sources and modules
- Telecom optical systems
- Passive optical components
- SWIR, sensing, and medical work
Applications and test requirements
Optical sources and modules
Characterize LED, FP-LD, DFB-LD, optical transceiver, and other active optical-device spectra.
Telecom optical systems
Evaluate DWDM systems, optical amplifiers, and related communication-band optical paths.
Passive optical components
SWIR, sensing, and medical work
Extend spectrum analysis into short-wave infrared, environmental sensing, and medical measurement applications.
Technical Specifications
| Parameter | Specification |
|---|---|
| Wavelength range | XOA-2400: 1200 to 2400 nm; XOA-2500: 1000 to 2500 nmBy model |
| Wavelength resolution settings | 0.05, 0.1, 0.2, 0.5, 1, and 2 nm |
| Wavelength accuracy | ±0.05 nm from 1520 to 1580 nm; ±0.10 nm from 1580 to 1620 nm; ±0.50 nm over each model's full range |
| Sensitivity | -65 dBm from 1800 to 2200 nm; -52 dBm from 1500 to 1800 nm and from 2200 to 2400 nm; -50 dBm from 1300 to 1500 nmHIGH3 |
| Dynamic range | 40 dB at ±0.4 nm peak offset; 50 dB at ±0.8 nm peak offset1523 nm, 0.05 nm resolution, HIGH1 to HIGH3 |
| Maximum input power | +20 dBm per channel over the full range |
| Maximum safe input | +25 dBm total input power |
| Supported fibers | SM 9.5/125 µm; MM GI 50/125 µm; GI 62.5/125 µm; large-core fiber up to 200 µm |
View all 21 specifications
| Parameter | Specification |
|---|---|
| Measurement architecture | Diffraction-grating optical spectrum analysis |
| Scan span | XOA-2400: 0.5 to 1200 nm including full range, plus 0 nm; XOA-2500: 0.5 to 1500 nm including full range, plus 0 nmBy model |
| Minimum sampling interval | 0.002 nm |
| Sample points | 101 to 50,001 plus AUTO |
| Wavelength linearity | ±0.01 nm from 1520 to 1580 nm |
| Wavelength repeatability | ±0.015 nm over 1 minute |
| Sensitivity settings | NORMAL, MID, HIGH1, HIGH2, and HIGH3 |
| Sensitivity outside bands | XOA-2400: no value is stated from 1200 to 1300 nm; XOA-2500: no value is stated from 1000 to 1300 nm or from 2400 to 2500 nmBy model |
| Power accuracy | ±1.0 dB1550 nm, -20 dBm input, MID or HIGH1 to HIGH3 |
| Power linearity | ±0.05 dB from -30 to +10 dBm inputHIGH1 to HIGH3 |
| Polarization dependence | ±0.2 dB at 1550 nm |
| Optical input | Free-space optical input |
| Display | 12.1-inch touch display |
Detailed performance and interface tables (4)
Model selection and acquisition (5 rows)
| Parameter | XOA-2400 | XOA-2500 |
|---|---|---|
| Wavelength range | 1200 to 2400 nm | 1000 to 2500 nm |
| Scan span | 0.5 to 1200 nm including full range; 0 nm | 0.5 to 1500 nm including full range; 0 nm |
| Standard resolution settings | 0.05, 0.1, 0.2, 0.5, 1, and 2 nm | 0.05, 0.1, 0.2, 0.5, 1, and 2 nm |
| Minimum sampling interval | 0.002 nm | 0.002 nm |
| Sample points | 101 to 50,001 plus AUTO | 101 to 50,001 plus AUTO |
Wavelength performance (5 rows)
| Parameter | Performance for both models |
|---|---|
| Accuracy, 1520 to 1580 nm | ±0.05 nm |
| Accuracy, 1580 to 1620 nm | ±0.10 nm |
| Accuracy over the model's full range | ±0.50 nm |
| Linearity, 1520 to 1580 nm | ±0.01 nm |
| Repeatability | ±0.015 nm over 1 minute |
Sensitivity coverage in HIGH3 (7 rows)
| Wavelength interval | XOA-2400 | XOA-2500 |
|---|---|---|
| 1000 to 1200 nm | Not applicable | Not specified |
| 1200 to 1300 nm | Not specified | Not specified |
| 1300 to 1500 nm | -50 dBm | -50 dBm |
| 1500 to 1800 nm | -52 dBm | -52 dBm |
| 1800 to 2200 nm | -65 dBm | -65 dBm |
| 2200 to 2400 nm | -52 dBm | -52 dBm |
| 2400 to 2500 nm | Not applicable | Not specified |
Optical input and fiber compatibility (1 row)
| Parameter | Specification |
|---|---|
| External-source calibration and alignment | Supported when the gas-absorption-cell calibration-source option is not fitted |
Performance notes
On the XOA-2400 / XOA-2500 Series, the -65 dBm figure applies only from 1800 to 2200 nm in HIGH3; adjacent bands have separate limits. Unspecified edge bands are not treated as zero and are not filled by extrapolating adjacent values.
The interval-specific accuracy values are not extended beyond their stated bands. The ±0.50 nm figure is the full-range value for each selected model. XOA-2400 / XOA-2500 dynamic-range values are tied to 1523 nm, 0.05 nm resolution, HIGH1 to HIGH3, and specific peak offsets.
Specifications are subject to change without notice.
Models, Configuration & Compatibility
XOA-2400 · XOA-2500
Model selection details
Choose XOA-2400 for 1200 to 2400 nm coverage. Choose XOA-2500 when the test window must extend down to 1000 nm, up to 2500 nm, or across both extended edges. The family description does not mean that XOA-2400 covers the complete 1000 to 2500 nm span. Wavelength range, sensitivity coverage, and conditioned performance must be checked separately.
Scan span is 0.5 to 1200 nm (XOA-2400) or 0.5 to 1500 nm (XOA-2500).
Technical Resources
Selection guidance
Format: Extended near-infrared and SWIR OSA
Coverage: 1200 to 2400 nm or 1000 to 2500 nm wavelength range by model; 0.05, 0.1, 0.2, 0.5, 1, and 2 nm standard resolution settings
Best for: Extended near-infrared and SWIR sources, telecom components, optical sensing, and medical optical measurement.
Compare products in the Optical Spectrum Analyzers categoryInformation for your quotation
XOA-2400 / XOA-2500 specifications do not state mechanical dimensions, mass, mains-power requirements, environmental limits, warranty terms, detailed remote-control interfaces, or standard-supply contents. Include those requirements, the selected model, wavelength band, expected optical power, desired input interface, and calibration documentation in the quote request.

