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Optical Spectrum Analyzers

XOA-2400 / XOA-2500 Series Optical Spectrum Analyzers

Extended-NIR and SWIR Optical Spectrum Analysis

XOA-2400 covers 1200–2400 nm and XOA-2500 covers 1000–2500 nm. Both are grating-based optical spectrum analyzers with standard 0.05–2 nm resolution settings for telecom, extended-NIR and SWIR tests.

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XOA-2400 / XOA-2500 Series Optical Spectrum Analyzers
Wavelength range
XOA-2400: 1200 to 2400 nm; XOA-2500: 1000 to 2500 nm
By model
Wavelength resolution settings
0.05, 0.1, 0.2, 0.5, 1, and 2 nm
Sensitivity
-65 dBm from 1800 to 2200 nm
HIGH3
Dynamic range
50 dB at ±0.8 nm peak offset
1523 nm, 0.05 nm resolution, HIGH1 to HIGH3

Overview

XOA-2400 covers 1200–2400 nm and XOA-2500 covers 1000–2500 nm. Both are grating-based optical spectrum analyzers with standard 0.05–2 nm resolution settings for telecom, extended-NIR and SWIR tests.

Additional product details

XOA-2400 covers 1200 to 2400 nm; XOA-2500 extends coverage to 1000 to 2500 nm.

The XOA-2400 / XOA-2500 12.1-inch touch interface and integrated analysis functions support LED, FP-LD, DFB-LD, optical-transceiver, DWDM, amplifier, fiber, grating, SWIR, sensing, and medical measurement workflows. On the XOA-2400 / XOA-2500 Series, a 0.002 nm minimum sampling interval and up to 50,001 points support detailed spectral capture, and free-space input and support for single-mode, graded-index, and large-core fibers accommodate diverse optical paths. The XOA-2400 / XOA-2500 Series also measures optical fiber, fiber gratings, and other passive optical components across the applicable model range.

Both XOA-2400 / XOA-2500 models have a 50 pm minimum standard setting: both models provide 0.05, 0.1, 0.2, 0.5, 1, and 2 nm resolution settings in the standard configuration. The XOA-2400 / XOA-2500 0.05 nm minimum standard resolution is the smallest of six standard resolution settings from 0.05 to 2 nm that both models share.

External-source calibration and optical-axis alignment on the XOA-2400 / XOA-2500 Series are supported when the gas-absorption-cell calibration-source option is not fitted. Specifications do not establish that calibration source as standard equipment.

Key Capabilities & Applications

Model-selected wavelength window

Choose 2400 or 2500 for the required spectral edges. Both provide 0.002 nm minimum sampling interval and 101–50,001 points plus AUTO.

Conditioned optical performance

HIGH3 sensitivity is −65 dBm at 1800–2200 nm, with separate neighboring-band limits. Wavelength accuracy is ±0.05 nm at 1520–1580 nm and ±0.50 nm across the selected model's full range.

Flexible input and calibration

Free-space input and single-mode, graded-index and large-core fibers up to 200 µm are supported. External-source calibration/alignment applies when the gas-absorption-cell calibration-source option is not fitted.

Common applications

  • Optical sources and modules
  • Telecom optical systems
  • Passive optical components
  • SWIR, sensing, and medical work
Applications and test requirements

Optical sources and modules

Characterize LED, FP-LD, DFB-LD, optical transceiver, and other active optical-device spectra.

Telecom optical systems

Evaluate DWDM systems, optical amplifiers, and related communication-band optical paths.

Passive optical components

SWIR, sensing, and medical work

Extend spectrum analysis into short-wave infrared, environmental sensing, and medical measurement applications.

Technical Specifications

ParameterSpecification
Wavelength rangeXOA-2400: 1200 to 2400 nm; XOA-2500: 1000 to 2500 nmBy model
Wavelength resolution settings0.05, 0.1, 0.2, 0.5, 1, and 2 nm
Wavelength accuracy±0.05 nm from 1520 to 1580 nm; ±0.10 nm from 1580 to 1620 nm; ±0.50 nm over each model's full range
Sensitivity-65 dBm from 1800 to 2200 nm; -52 dBm from 1500 to 1800 nm and from 2200 to 2400 nm; -50 dBm from 1300 to 1500 nmHIGH3
Dynamic range40 dB at ±0.4 nm peak offset; 50 dB at ±0.8 nm peak offset1523 nm, 0.05 nm resolution, HIGH1 to HIGH3
Maximum input power+20 dBm per channel over the full range
Maximum safe input+25 dBm total input power
Supported fibersSM 9.5/125 µm; MM GI 50/125 µm; GI 62.5/125 µm; large-core fiber up to 200 µm
View all 21 specifications
ParameterSpecification
Measurement architectureDiffraction-grating optical spectrum analysis
Scan spanXOA-2400: 0.5 to 1200 nm including full range, plus 0 nm; XOA-2500: 0.5 to 1500 nm including full range, plus 0 nmBy model
Minimum sampling interval0.002 nm
Sample points101 to 50,001 plus AUTO
Wavelength linearity±0.01 nm from 1520 to 1580 nm
Wavelength repeatability±0.015 nm over 1 minute
Sensitivity settingsNORMAL, MID, HIGH1, HIGH2, and HIGH3
Sensitivity outside bandsXOA-2400: no value is stated from 1200 to 1300 nm; XOA-2500: no value is stated from 1000 to 1300 nm or from 2400 to 2500 nmBy model
Power accuracy±1.0 dB1550 nm, -20 dBm input, MID or HIGH1 to HIGH3
Power linearity±0.05 dB from -30 to +10 dBm inputHIGH1 to HIGH3
Polarization dependence±0.2 dB at 1550 nm
Optical inputFree-space optical input
Display12.1-inch touch display
Detailed performance and interface tables (4)
Model selection and acquisition (5 rows)
Model selection and acquisition
ParameterXOA-2400XOA-2500
Wavelength range1200 to 2400 nm1000 to 2500 nm
Scan span0.5 to 1200 nm including full range; 0 nm0.5 to 1500 nm including full range; 0 nm
Standard resolution settings0.05, 0.1, 0.2, 0.5, 1, and 2 nm0.05, 0.1, 0.2, 0.5, 1, and 2 nm
Minimum sampling interval0.002 nm0.002 nm
Sample points101 to 50,001 plus AUTO101 to 50,001 plus AUTO
Wavelength performance (5 rows)
Wavelength performance
ParameterPerformance for both models
Accuracy, 1520 to 1580 nm±0.05 nm
Accuracy, 1580 to 1620 nm±0.10 nm
Accuracy over the model's full range±0.50 nm
Linearity, 1520 to 1580 nm±0.01 nm
Repeatability±0.015 nm over 1 minute
Sensitivity coverage in HIGH3 (7 rows)
Sensitivity coverage in HIGH3
Wavelength intervalXOA-2400XOA-2500
1000 to 1200 nmNot applicableNot specified
1200 to 1300 nmNot specifiedNot specified
1300 to 1500 nm-50 dBm-50 dBm
1500 to 1800 nm-52 dBm-52 dBm
1800 to 2200 nm-65 dBm-65 dBm
2200 to 2400 nm-52 dBm-52 dBm
2400 to 2500 nmNot applicableNot specified
Optical input and fiber compatibility (1 row)
Optical input and fiber compatibility
ParameterSpecification
External-source calibration and alignmentSupported when the gas-absorption-cell calibration-source option is not fitted
Performance notes

On the XOA-2400 / XOA-2500 Series, the -65 dBm figure applies only from 1800 to 2200 nm in HIGH3; adjacent bands have separate limits. Unspecified edge bands are not treated as zero and are not filled by extrapolating adjacent values.

The interval-specific accuracy values are not extended beyond their stated bands. The ±0.50 nm figure is the full-range value for each selected model. XOA-2400 / XOA-2500 dynamic-range values are tied to 1523 nm, 0.05 nm resolution, HIGH1 to HIGH3, and specific peak offsets.

Specifications are subject to change without notice.

Models, Configuration & Compatibility

XOA-2400 · XOA-2500

Model selection details

Choose XOA-2400 for 1200 to 2400 nm coverage. Choose XOA-2500 when the test window must extend down to 1000 nm, up to 2500 nm, or across both extended edges. The family description does not mean that XOA-2400 covers the complete 1000 to 2500 nm span. Wavelength range, sensitivity coverage, and conditioned performance must be checked separately.

Scan span is 0.5 to 1200 nm (XOA-2400) or 0.5 to 1500 nm (XOA-2500).

Technical Resources

Download Datasheet

PDF technical specifications

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Selection guidance

Format: Extended near-infrared and SWIR OSA

Coverage: 1200 to 2400 nm or 1000 to 2500 nm wavelength range by model; 0.05, 0.1, 0.2, 0.5, 1, and 2 nm standard resolution settings

Best for: Extended near-infrared and SWIR sources, telecom components, optical sensing, and medical optical measurement.

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Information for your quotation

XOA-2400 / XOA-2500 specifications do not state mechanical dimensions, mass, mains-power requirements, environmental limits, warranty terms, detailed remote-control interfaces, or standard-supply contents. Include those requirements, the selected model, wavelength band, expected optical power, desired input interface, and calibration documentation in the quote request.