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XGY Datasheet

XOA-2400 / XOA-2500 Optical Spectrum Analyzers

Extended near-infrared and SWIR optical spectrum analysis to 2400 nm or 2500 nm, depending on model

XGY XOA-2400 and XOA-2500 are grating-based optical spectrum analyzers for telecom, extended near-infrared, and short-wave infrared measurement. Choose XOA-2400 for 1200 to 2400 nm or XOA-2500 for 1000 to 2500 nm, then verify the wavelength-dependent sensitivity, accuracy, and dynamic-range conditions required by the application.

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XOA-2400 / XOA-2500 Optical Spectrum Analyzers

Core Specifications

Compare wavelength coverage, finest applicable resolution and conditioned sensitivity before reviewing the complete source-backed specification table.

MODEL RANGES

1200 to 2400 nm / 1000 to 2500 nm

FINEST STANDARD RESOLUTION

0.05 nm

SENSITIVITY

-65 dBm at 1800 to 2200 nm

Application and capability fit

Match the optical measurement window before selecting a model.

Use wavelength range, resolution, sensitivity, dynamic-range conditions, input coupling and analysis workflow together. A headline value should not be extended beyond its published model, wavelength interval or test condition.

Measurement capability

Two Extended-Wavelength Models

Select XOA-2400 for 1200 to 2400 nm or XOA-2500 when the measurement must reach 1000 nm, 2500 nm, or both edges.

Measurement capability

0.05 nm Minimum Standard Resolution

Both models share six standard resolution settings from 0.05 to 2 nm.

Measurement capability

High-Density Spectral Capture

A 0.002 nm sampling interval and up to 50,001 points support detailed broadband measurements.

Measurement capability

Wavelength-Qualified Sensitivity

Sensitivity limits are separated into 1300 to 1500 nm, 1500 to 1800 nm, 1800 to 2200 nm, and 2200 to 2400 nm bands.

Measurement capability

Conditioned Dynamic Range

Published values are tied to 1523 nm, 0.05 nm resolution, HIGH1 to HIGH3, and specific peak offsets.

Measurement capability

Free-Space and Fiber Input

Use free-space paths or compatible single-mode, graded-index, and large-core fibers.

Measurement capability

Touch-Driven Analysis

A 12.1-inch interface supports multi-application analysis of optical sources, modules, and components.

Measurement capability

Calibration Pathway

External-source calibration and optical-axis alignment are supported when the gas-cell calibration-source option is not installed.

Extended Near-Infrared and SWIR Optical Spectrum Analysis

The XOA-2400 / XOA-2500 Series measures optical spectra from telecom wavelengths into the short-wave infrared. Choose XOA-2400 for 1200 to 2400 nm coverage. Choose XOA-2500 when the test window must extend down to 1000 nm, up to 2500 nm, or across both extended edges.

The family description does not mean that XOA-2400 covers the complete 1000 to 2500 nm span. Wavelength range, sensitivity coverage, and conditioned performance must be checked separately.

Model Selection

ParameterXOA-2400XOA-2500
Wavelength range1200 to 2400 nm1000 to 2500 nm
Scan span0.5 to 1200 nm including full range; 0 nm0.5 to 1500 nm including full range; 0 nm
Standard resolution settings0.05, 0.1, 0.2, 0.5, 1, and 2 nm0.05, 0.1, 0.2, 0.5, 1, and 2 nm
Minimum sampling interval0.002 nm0.002 nm
Sample points101 to 50,001 plus AUTO101 to 50,001 plus AUTO

Wavelength Performance

ParameterPublished performance for both models
Accuracy, 1520 to 1580 nm±0.05 nm
Accuracy, 1580 to 1620 nm±0.10 nm
Accuracy over the model’s full range±0.50 nm
Linearity, 1520 to 1580 nm±0.01 nm
Repeatability±0.015 nm over 1 minute

The interval-specific accuracy values are not extended beyond their stated bands. The ±0.50 nm figure is the full-range value for each selected model.

Sensitivity Coverage in HIGH3

Wavelength intervalXOA-2400XOA-2500
1000 to 1200 nmNot applicableNot specified
1200 to 1300 nmNot specifiedNot specified
1300 to 1500 nm-50 dBm-50 dBm
1500 to 1800 nm-52 dBm-52 dBm
1800 to 2200 nm-65 dBm-65 dBm
2200 to 2400 nm-52 dBm-52 dBm
2400 to 2500 nmNot applicableNot specified

Unspecified edge bands are not treated as zero and are not filled by extrapolating adjacent values.

Dynamic Range and Optical Power

  • Dynamic range: 40 dB at ±0.4 nm from the peak and 50 dB at ±0.8 nm from the peak, specified at 1523 nm, 0.05 nm resolution, and HIGH1 to HIGH3.
  • Maximum input: +20 dBm per channel over the full model range.
  • Maximum safe input: +25 dBm total input power.
  • Power accuracy: ±1.0 dB at 1550 nm and -20 dBm input in MID or HIGH1 to HIGH3.
  • Power linearity: ±0.05 dB from -30 to +10 dBm input in HIGH1 to HIGH3.
  • Polarization dependence: ±0.2 dB at 1550 nm.

Optical Input and Applications

Both models support free-space optical input, SM 9.5/125 µm fiber, MM GI 50/125 µm, GI 62.5/125 µm, and large-core fiber up to 200 µm. The 12.1-inch touch interface and integrated analysis functions support LED, FP-LD, DFB-LD, optical-transceiver, DWDM, amplifier, fiber, grating, SWIR, sensing, and medical measurement workflows.

External-source calibration and optical-axis alignment are supported when the gas-absorption-cell calibration-source option is not fitted. Published specifications do not establish that calibration source as standard equipment.

Scope to Confirm During Quotation

Published XOA-2400 / XOA-2500 specifications do not state mechanical dimensions, mass, mains-power requirements, environmental limits, warranty terms, detailed remote-control interfaces, or standard-supply contents. Include those requirements, the selected model, wavelength band, expected optical power, desired input interface, and calibration documentation in the quote request.

Key Advantages

  • Model-Specific SWIR Coverage XOA-2400 covers 1200 to 2400 nm; XOA-2500 extends coverage to 1000 to 2500 nm.
  • 50 pm Minimum Standard Setting Both models provide 0.05, 0.1, 0.2, 0.5, 1, and 2 nm resolution settings in the standard configuration.
  • Sensitivity to -65 dBm The -65 dBm figure applies only from 1800 to 2200 nm in HIGH3; adjacent bands have separate limits.
  • Conditioned 50 dB Dynamic Range Specified at 1523 nm, 0.05 nm resolution, HIGH1 to HIGH3, and ±0.8 nm from the peak.
  • Fine Sampling A 0.002 nm minimum sampling interval and up to 50,001 points support detailed spectral capture.
  • Flexible Optical Input Free-space input and support for single-mode, graded-index, and large-core fibers accommodate diverse optical paths.

Performance Highlights

  • XOA-2400 Range 1200 to 2400 nm
  • XOA-2500 Range 1000 to 2500 nm
  • Resolution 0.05 nm minimum in the standard configuration
  • Sensitivity -65 dBm from 1800 to 2200 nm in HIGH3

Looking for a custom optical spectrum analyzer solution?

Send the wavelength band, source or device type, expected optical power, required resolution, coupling method and acceptance requirements for configuration review.

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Product Specifications

Parameter Specification
Models XOA-2400 and XOA-2500
Measurement Architecture Diffraction-grating optical spectrum analysis
Wavelength Range XOA-2400: 1200 to 2400 nm; XOA-2500: 1000 to 2500 nm
Scan Span XOA-2400: 0.5 to 1200 nm including full range, plus 0 nm; XOA-2500: 0.5 to 1500 nm including full range, plus 0 nm
Wavelength Resolution Settings 0.05, 0.1, 0.2, 0.5, 1, and 2 nm Condition: Both models
Minimum Sampling Interval 0.002 nm Condition: Both models
Sample Points 101 to 50,001 plus AUTO Condition: Both models
Wavelength Accuracy ±0.05 nm from 1520 to 1580 nm; ±0.10 nm from 1580 to 1620 nm; ±0.50 nm over each model's full range Condition: Both models
Wavelength Linearity ±0.01 nm from 1520 to 1580 nm Condition: Both models
Wavelength Repeatability ±0.015 nm over 1 minute Condition: Both models
Sensitivity Settings NORMAL, MID, HIGH1, HIGH2, and HIGH3 Condition: Both models
Sensitivity -65 dBm from 1800 to 2200 nm; -52 dBm from 1500 to 1800 nm and from 2200 to 2400 nm; -50 dBm from 1300 to 1500 nm Condition: HIGH3; both models
Sensitivity Outside Published Bands XOA-2400: no published value is stated from 1200 to 1300 nm; XOA-2500: no published value is stated from 1000 to 1300 nm or from 2400 to 2500 nm
Dynamic Range 40 dB at ±0.4 nm peak offset; 50 dB at ±0.8 nm peak offset Condition: 1523 nm, 0.05 nm resolution, HIGH1 to HIGH3; both models
Maximum Input Power +20 dBm per channel over the full range Condition: Both models
Maximum Safe Input +25 dBm total input power Condition: Both models
Power Accuracy ±1.0 dB Condition: 1550 nm, -20 dBm input, MID or HIGH1 to HIGH3; both models
Power Linearity ±0.05 dB from -30 to +10 dBm input Condition: HIGH1 to HIGH3; both models
Polarization Dependence ±0.2 dB at 1550 nm Condition: Both models
Optical Input Free-space optical input Condition: Both models
Supported Fibers SM 9.5/125 µm; MM GI 50/125 µm; GI 62.5/125 µm; large-core fiber up to 200 µm Condition: Both models
Display 12.1-inch touch display
External-Source Calibration and Alignment Supported when the gas-absorption-cell calibration-source option is not fitted Condition: Both models

* Specifications are subject to change without notice. Contact XGY Tek for full technical datasheet.

Technical Resources

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Pre-filled product inquiry

Fit check

Use this model when its published optical window contains the complete measurement.

Strong fit

  • Projects focused on LED, FP-LD, DFB-LD, optical-transceiver, and active-source characterization
  • Projects focused on DWDM systems and optical-amplifier evaluation
  • Projects focused on Optical fiber, fiber-grating, and passive-component measurement
  • Projects focused on Extended near-infrared and SWIR source analysis
  • Projects focused on Environmental and optical sensing
  • Projects focused on Medical optical measurement

Review alternatives

  • Wavelengths outside the selected model's published measurement range
  • Resolution, sensitivity or dynamic-range requirements outside the stated test conditions
  • Input-power levels or fibre configurations that have not been checked against the published limits
  • Projects without a defined source, device, wavelength window or acceptance method

Quote-stage checklist

Optical spectrum analyzer RFQ checklist

Wavelength range and scan spanRequired resolution and sampling intervalExpected optical-power rangeSensitivity and dynamic-range targetFree-space or fibre inputConnector and fibre typeCalibration and alignment methodAnalysis and storage workflowRemote-control interfacesRequired acceptance documentation

Include any wavelength-specific accuracy, sensitivity or dynamic-range condition that must be demonstrated during acceptance testing.

Optical analyzer selection workflow

Turn the source and device requirements into a traceable configuration.

A useful optical spectrum analyzer RFQ defines the measurement window, optical-power envelope, coupling method and evidence required from the finished setup.

Send optical analyzer RFQ
01

Set wavelength and resolution

Range and resolution map

Confirm the source wavelength, required span, line separation and sampling requirement against the selected model's published range.

02

Check sensitivity and input limits

Optical-power envelope

Match expected optical power, sensitivity mode, averaging, dynamic-range condition and safe-input limit to the real measurement.

03

Lock coupling and acceptance evidence

Configuration checklist

Confirm free-space or fibre input, connector and fibre type, calibration method, analysis functions, remote-control needs and acceptance records.

Frequently Asked Questions

What should buyers know about XOA-2400 / XOA-2500 Optical Spectrum Analyzers?

This product page summarises XOA-2400 / XOA-2500 Optical Spectrum Analyzers within XGY Tek's Optical Spectrum Analyzers catalogue. Review the published specifications and application notes to determine whether the product matches the intended workflow.

Which published specifications should buyers compare for XOA-2400 / XOA-2500 Optical Spectrum Analyzers?

Start with the values highlighted on this page: Models: XOA-2400 and XOA-2500; Measurement Architecture: Diffraction-grating optical spectrum analysis; Wavelength Range: XOA-2400: 1200 to 2400 nm; XOA-2500: 1000 to 2500 nm; Scan Span: XOA-2400: 0.5 to 1200 nm including full range, plus 0 nm; XOA-2500: 0.5 to 1500 nm including full range, plus 0 nm. Check whichever selection criteria apply, such as measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, accessories, and any stated test conditions. Not every criterion applies to every product.

How should XOA-2400 / XOA-2500 Optical Spectrum Analyzers be matched to an application?

Published applications include LED, FP-LD, DFB-LD, optical-transceiver, and active-source characterization; DWDM systems and optical-amplifier evaluation; Optical fiber, fiber-grating, and passive-component measurement; Extended near-infrared and SWIR source analysis; Environmental and optical sensing. Use the application notes as selection guidance, then confirm the required operating conditions, interfaces, software compatibility, and accessories against the published specifications.

When should buyers compare another option in Optical Spectrum Analyzers?

Compare alternatives when the published measurement or operating range, resolution, accuracy, sensitivity, interfaces, software compatibility, environmental limits, or available accessories do not match the intended workflow. Confirm any critical value together with its stated conditions before selecting a configuration.

How can I request a quote or datasheet for XOA-2400 / XOA-2500 Optical Spectrum Analyzers?

Use the Get a Quote form to share the application, required configuration, interfaces, accessories, documentation needs, and timing. XGY Tek will review the request before confirming a suitable configuration. A downloadable datasheet is linked from the product page.Get a Quote

What support information is available for XOA-2400 / XOA-2500 Optical Spectrum Analyzers?

Support scope is confirmed during quotation. Ask about commissioning, software integration, calibration documentation, acceptance requirements, training, accessories, spares, and service arrangements relevant to the application.About XGY TekWhere to Buy

Looking for a custom optical spectrum analyzer solution?

Send the wavelength band, source or device type, expected optical power, required resolution, coupling method and acceptance requirements for configuration review.