Signal Generators
YSG-400B Series Signal Generator
9 kHz to 40 GHz CW, sweep and pulse signal generation.
Benchtop RF stimulus for device, radar and communication tests, with 0.001 Hz frequency resolution and standard internal pulse generation.
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- Frequency range
- 9 kHz to 40 GHz
- Output power
- -120 to +17 dBm
- 100 kHz to 40 GHz
- Phase noise
- -110 dBc/Hz
- 10 kHz offset, 10 GHz
- Frequency resolution
- 0.001 Hz
Overview
YSG-400B provides benchtop RF stimulus from 9 kHz to 40 GHz for device characterization, radar development and communication tests. CW and sweep operation, 0.001 Hz frequency resolution and standard internal pulse generation support repeatable signal setup.
Output power is −120 to +17 dBm from 100 kHz to 40 GHz, and −120 to +13 dBm from 9 kHz to 100 kHz. USB, Ethernet, pulse/trigger I/O and external reference connections support test-system integration.
Product & Measurement Gallery
Typical output power at -20 dBm
Output power versus frequency.
Typical output power at +17 dBm
The reference trace extends beyond the standard model range; extension availability must be confirmed.
SSB phase noise — lower carrier
Phase-noise trace with carrier frequency and frequency-offset axes.
SSB phase noise — higher carrier
Phase-noise trace with carrier frequency and frequency-offset axes.
Output-level reference curves
Output-level reference curves with level legend and frequency axis.
Additional product details
The YSG-400B output power ranges from -120 dBm to +17 dBm (100 kHz to 40 GHz), supporting signal generation from ultra-low levels to high dynamic outputs.
The YSG-400B provides 0.001 Hz frequency resolution across the operating range.
Key Capabilities & Applications
Broadband CW and sweep stimulus
Set signals across 9 kHz to 40 GHz with 0.001 Hz frequency resolution. The output-power envelope depends on frequency and temperature.
Standard pulse generation
An internal pulse generator and pulse modulation are included as standard for radar and pulsed-signal testing.
Bench and automation integration
Four USB 2.0 ports, Ethernet, BNC pulse/trigger connections and 10 MHz / 100 MHz reference outputs connect the generator to the test environment.
All capabilities and operating conditions
Pulse modulation
Built-in pulse modulation with internal pulse generation capability supports radar and pulsed-signal testing applications.
Compact design
360 mm × 360 mm × 89 mm benchtop form factor.
Versatile connectivity
Four USB 2.0 ports, Ethernet, BNC pulse and trigger I/O, and 10/100 MHz reference outputs support RF test environment integration.
Common applications
- Semiconductor test and characterization
- Quantum technology research
- Radar system development
- Advanced communication applications
- Professional test and measurement applications
Applications and test requirements
Semiconductor test and characterization
Precision signal generation for device and component test.
Quantum technology research
Radar system development
Advanced communication applications
Professional test and measurement applications
Technical Specifications
| Parameter | Specification |
|---|---|
| Frequency range | 9 kHz to 40 GHz |
| Frequency resolution | 0.001 Hz |
| Output power | -120 to +17 dBm100 kHz to 40 GHz |
| Output power at low frequency | -120 to +13 dBm9 kHz to 100 kHz |
| Phase noise | -110 dBc/Hz10 kHz offset, 10 GHz |
| Pulse modulation | StandardInternal pulse generator |
| RF output connector | 2.9 mm Male50 Ω |
| Interface | USB 2.0 (4x), Ethernet, BNC pulse/trigger I/O, 10/100 MHz reference |
View all 20 specifications
| Parameter | Specification |
|---|---|
| Operating mode | CW / Sweep |
| Harmonics | -50 dBc10 GHz |
| Spurious | -80 dBc10 GHz |
| Display | 5-inch screenWith keypad and knob |
| Dimensions | 360 × 360 × 89 mm |
| Output power resolution | 0.1 dB |
| Frequency switching time | 10 msTypical; RF settled, ALC enabled |
| Internal reference aging | ±0.3 ppm/yearTypical |
| Initial reference calibration accuracy | ±0.1 ppm+23 ±5 °C |
| External reference input | 10 MHz, 50 Ω |
| External reference lock range | ±0.5 ppmRelative to the 10 MHz reference input |
| AC input | 110 to 240 V |
Detailed performance and interface tables (2)
| Parameter | Value |
|---|---|
| Accepted sine-wave input | +3 to +10 dBm, 50 Ω |
| Accepted square-wave input | CMOS/TTL compatible, 0 to +3.3 V, 50 Ω |
| Reference output frequencies | 10 MHz and 100 MHz |
| Reference output power | +5 to +10 dBm for each output |
| Reference output frequency stability | ±0.1 ppm |
| 10 MHz output SSB phase noise | -145 dBc/Hz at 1 kHz offset |
| 100 MHz output SSB phase noise | -155 dBc/Hz at 1 kHz offset |
| Reference output spurious | -70 dBc |
| Frequency interval | Typical VSWR |
|---|---|
| 9 kHz to 6 GHz | 1.6 |
| 6 GHz to 40 GHz | 2 |
Level ≤0 dBm, ALC enabled. Coverage here is limited to the standard 40 GHz model; the 43 GHz extension is an option.
- Maximum output power may vary with frequency and temperature.
Specifications are subject to change without notice.
Models, Configuration & Compatibility
YSG-400B
Model comparison (1)
| Parameter | YSG-200B | YSG-400B |
|---|---|---|
| Frequency range | 9 kHz to 20 GHz | 9 kHz to 40 GHz |
Control interfaces and software
Four USB 2.0 ports and an RJ45 Ethernet port support connection to the test environment. Rear-panel BNC connectors provide pulse-signal I/O, trigger input, 10 MHz reference input, and 10 MHz / 100 MHz reference outputs.
USB 2.0 · Ethernet · Pulse and trigger I/O
Order codes and configuration are confirmed in the quotation.
Technical Resources
Selection guidance
Format: Compact benchtop
Coverage: 9 kHz to 40 GHz; -120 to +17 dBm output from 100 kHz to 40 GHz; 0.001 Hz resolution
Best for: Benchtop CW, sweep, and pulse stimulus requiring a broad low-level-to-positive-power output range.
The YSG-400B is designed for professional test and measurement environments where spectral purity, frequency agility, and cost efficiency are important.
Send the operating envelope, configuration and acceptance evidence you need; the quotation confirms model, options and delivery documentation.


