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Signal Generators

YSG-400B Series Signal Generator

9 kHz to 40 GHz CW, sweep and pulse signal generation.

Benchtop RF stimulus for device, radar and communication tests, with 0.001 Hz frequency resolution and standard internal pulse generation.

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YSG-400B Series Signal Generator
Frequency range
9 kHz to 40 GHz
Output power
-120 to +17 dBm
100 kHz to 40 GHz
Phase noise
-110 dBc/Hz
10 kHz offset, 10 GHz
Frequency resolution
0.001 Hz

Overview

YSG-400B provides benchtop RF stimulus from 9 kHz to 40 GHz for device characterization, radar development and communication tests. CW and sweep operation, 0.001 Hz frequency resolution and standard internal pulse generation support repeatable signal setup.

Output power is −120 to +17 dBm from 100 kHz to 40 GHz, and −120 to +13 dBm from 9 kHz to 100 kHz. USB, Ethernet, pulse/trigger I/O and external reference connections support test-system integration.

Additional product details

The YSG-400B output power ranges from -120 dBm to +17 dBm (100 kHz to 40 GHz), supporting signal generation from ultra-low levels to high dynamic outputs.

The YSG-400B provides 0.001 Hz frequency resolution across the operating range.

Key Capabilities & Applications

Broadband CW and sweep stimulus

Set signals across 9 kHz to 40 GHz with 0.001 Hz frequency resolution. The output-power envelope depends on frequency and temperature.

Standard pulse generation

An internal pulse generator and pulse modulation are included as standard for radar and pulsed-signal testing.

Bench and automation integration

Four USB 2.0 ports, Ethernet, BNC pulse/trigger connections and 10 MHz / 100 MHz reference outputs connect the generator to the test environment.

All capabilities and operating conditions

Pulse modulation

Built-in pulse modulation with internal pulse generation capability supports radar and pulsed-signal testing applications.

Compact design

360 mm × 360 mm × 89 mm benchtop form factor.

Versatile connectivity

Four USB 2.0 ports, Ethernet, BNC pulse and trigger I/O, and 10/100 MHz reference outputs support RF test environment integration.

Common applications

  • Semiconductor test and characterization
  • Quantum technology research
  • Radar system development
  • Advanced communication applications
  • Professional test and measurement applications
Applications and test requirements

Semiconductor test and characterization

Precision signal generation for device and component test.

Quantum technology research

Radar system development

Advanced communication applications

Professional test and measurement applications

Technical Specifications

ParameterSpecification
Frequency range9 kHz to 40 GHz
Frequency resolution0.001 Hz
Output power-120 to +17 dBm100 kHz to 40 GHz
Output power at low frequency-120 to +13 dBm9 kHz to 100 kHz
Phase noise-110 dBc/Hz10 kHz offset, 10 GHz
Pulse modulationStandardInternal pulse generator
RF output connector2.9 mm Male50 Ω
InterfaceUSB 2.0 (4x), Ethernet, BNC pulse/trigger I/O, 10/100 MHz reference
View all 20 specifications
ParameterSpecification
Operating modeCW / Sweep
Harmonics-50 dBc10 GHz
Spurious-80 dBc10 GHz
Display5-inch screenWith keypad and knob
Dimensions360 × 360 × 89 mm
Output power resolution0.1 dB
Frequency switching time10 msTypical; RF settled, ALC enabled
Internal reference aging±0.3 ppm/yearTypical
Initial reference calibration accuracy±0.1 ppm+23 ±5 °C
External reference input10 MHz, 50 Ω
External reference lock range±0.5 ppmRelative to the 10 MHz reference input
AC input110 to 240 V
Detailed performance and interface tables (2)
Reference input and output
ParameterValue
Accepted sine-wave input+3 to +10 dBm, 50 Ω
Accepted square-wave inputCMOS/TTL compatible, 0 to +3.3 V, 50 Ω
Reference output frequencies10 MHz and 100 MHz
Reference output power+5 to +10 dBm for each output
Reference output frequency stability±0.1 ppm
10 MHz output SSB phase noise-145 dBc/Hz at 1 kHz offset
100 MHz output SSB phase noise-155 dBc/Hz at 1 kHz offset
Reference output spurious-70 dBc
RF output match
Frequency intervalTypical VSWR
9 kHz to 6 GHz1.6
6 GHz to 40 GHz2

Level ≤0 dBm, ALC enabled. Coverage here is limited to the standard 40 GHz model; the 43 GHz extension is an option.

  • Maximum output power may vary with frequency and temperature.

Specifications are subject to change without notice.

Models, Configuration & Compatibility

YSG-400B

Model comparison (1)
YSG-200B and YSG-400B
ParameterYSG-200BYSG-400B
Frequency range9 kHz to 20 GHz9 kHz to 40 GHz
Control interfaces and software

Four USB 2.0 ports and an RJ45 Ethernet port support connection to the test environment. Rear-panel BNC connectors provide pulse-signal I/O, trigger input, 10 MHz reference input, and 10 MHz / 100 MHz reference outputs.

USB 2.0 · Ethernet · Pulse and trigger I/O

Order codes and configuration are confirmed in the quotation.

Technical Resources

Download Datasheet

PDF technical specifications

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Selection guidance

Format: Compact benchtop

Coverage: 9 kHz to 40 GHz; -120 to +17 dBm output from 100 kHz to 40 GHz; 0.001 Hz resolution

Best for: Benchtop CW, sweep, and pulse stimulus requiring a broad low-level-to-positive-power output range.

The YSG-400B is designed for professional test and measurement environments where spectral purity, frequency agility, and cost efficiency are important.

Compare products in the Signal Generators category

Send the operating envelope, configuration and acceptance evidence you need; the quotation confirms model, options and delivery documentation.