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Source Measure Units

Compare XMU Source Measure Units

Source Measure Units (SMUs) combine programmable sourcing and measurement in one PXIe module, so the parameter that binds first is the source-and-measure envelope the device under test actually needs, not the channel count. The four-channel XMU-5422 and XMU-5421 share a +/-24 V and +/-150 mA envelope at 600 kS/s in a 3U, 4 HP module, and are separated only by resolution grade: 10 pA and 20 uV on the XMU-5422 against 100 pA and 200 uV on the XMU-5421.

The 32-channel XMU-5921 trades that envelope for density, sourcing within +/-15 V and +/-32 mA at 1 MS/s with 80 pA resolution on its 5 uA range, so it answers a throughput problem rather than a precision one - a device needing +/-24 V does not become a 32-channel job by adding channels.

At the low-current end the fixture, cabling, and guarding decide the result as much as the module does, which is why a credible measurement record should carry the selected current range, compliance setting, integration or aperture time, settling delay, guarding and cable type, fixture or probe station details, reference-device reading, repeatability run, and raw data export.

Settle the required source ranges, compliance limits, sweep or pulse timing, number of biased terminals, software interface, and report format before requesting a quote.

Selection path

XMU Model Comparison

Use the model pages and current datasheets for the released configuration limits and conditions.

  • XMU-54223U PXIe, 4 HP
    Coverage
    4 channels; ±24 V voltage range; ±150 mA maximum current range; 600 kSa/s sampling; current resolution down to 10 pA
    Best fit
    Four-channel low-current characterization requiring the highest precision among these models.
  • XMU-54213U PXIe, 4 HP
    Coverage
    4 channels; ±24 V voltage range; ±150 mA maximum current range; 600 kSa/s sampling; current resolution down to 100 pA
    Best fit
    Four-channel automated device characterization where 100 pA current resolution is sufficient.
  • XMU-59213U PXIe, 78-pin D-Sub
    Coverage
    32 channels; ±15 V and ±32 mA operating envelope; 1 MSa/s sampling; current resolution down to 80 pA
    Best fit
    Synchronized high-density semiconductor, sensor, LED/LD, and battery characterization.

Frequently Asked Questions

When should XMU-5422 or XMU-5421 be chosen over XMU-5921?
Choose XMU-5422 or XMU-5421 when four channels, +/-24 V and +/-150 mA ranges, and 10 pA or 100 pA current resolution fit the DUT. Choose the 32-channel XMU-5921 when synchronized channel density is the primary requirement and its +/-15 V and +/-32 mA operating envelope fits the test.
What acceptance checks should be run for low-current SMU work?
Run open and short checks, guarded fixture checks, cable leakage review, reference-device measurement, repeatability checks, compliance behavior tests, and exported-data review. Low-current performance should be accepted as a complete measurement setup, not as an isolated instrument claim.
What information should be sent with an SMU enquiry?
Send DUT type, required source ranges, expected measured current, compliance limits, pulse or sweep timing, number of biased terminals, fixture or probe station details, cabling type, software interface, and the required data/report format.
Why does compliance behavior matter?
Compliance protects the DUT when the device enters a low-impedance, breakdown, or fault state. The acceptance test should prove the configured voltage or current limit, the trip response, and the data recorded when the limit is reached.
When is guarding mandatory?
Guarding becomes mandatory when leakage through cables, fixtures, probe cards, or contamination can approach the measured current. For ultra-low-current work, the fixture and cabling are part of the measurement system.

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