Source Measure Units
XMU-5921 32-Channel Source Measure Unit
Thirty-two synchronized four-quadrant source-and-measure channels.
Dense PXIe device characterization within a ±15 V, ±32 mA envelope, with current resolution down to 80 pA on the 5 µA range.
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- Channels
- 32 synchronized source-and-measure channels
- Voltage range
- ±15 V operating envelope
- Current range
- ±32 mA operating envelope
- Sampling
- 1 MSa/s
Overview
XMU-5921 integrates 32 synchronized source-and-measure channels in a 3U PXIe module. Four-quadrant operation covers a ±15 V, ±32 mA envelope, with 5 V, 10 V and 15 V voltage ranges, five current ranges and 1 MSa/s sampling for parallel device characterization.
Additional product details
On the XMU-5921, four-quadrant operation and a 1 MSa/s sampling rate support parallel semiconductor, optoelectronic, sensor, aerospace, power-electronics, and battery-characterization workflows. The XMU-5921 5 µA current range provides 80 pA programming and measurement resolution. For power electronics, the XMU-5921 provides four-quadrant characterization of power-electronic components within the stated voltage-current envelope.
Key Capabilities & Applications
Synchronized four-quadrant testing
Thirty-two channels support four-quadrant sourcing and measurement within the stated ±15 V and ±32 mA operating envelope.
Range-specific fine resolution
The 5 V range provides 80 µV voltage resolution, and the 5 µA range provides 80 pA current programming and measurement resolution. Resolution changes with the selected range.
PXIe fixture integration
A 78-pin D-Sub connects the outputs. A VISA-based DLL supports Windows and Linux; the stated sampling rate is 1 MSa/s.
Common applications
- Semiconductor device test
- LED and LD test
- Sensor characterization
- Aerospace electronics
- Power electronics
- Battery characterization
Applications and test requirements
Semiconductor device test
Synchronized current-voltage characterization and automated test for semiconductor components.
LED and LD test
Voltage-current sweeps and pulsed evaluation for LEDs and laser diodes.
Sensor characterization
Precision stimulus and response measurement for sensor development and validation.
Aerospace electronics
Automated sourcing and measurement for aerospace electronic assemblies and devices.
Power electronics
Battery characterization
Controlled sourcing and measurement for battery and cell characteristic evaluation.
Technical Specifications
| Parameter | Specification |
|---|---|
| Channels | 32 synchronized source-and-measure channels |
| Operation | Four-quadrant source/measure |
| Voltage range | 5 V / 10 V / 15 V; ±15 V operating envelope |
| Current range | 5 µA / 40 µA / 200 µA / 2 mA / 32 mA; ±32 mA operating envelope |
| Voltage resolution | Down to 80 µV |
| Current sensitivity | Down to 80 pA |
| Sampling | 1 MSa/s |
| Output connector | 78-pin D-Sub |
View all 13 specifications
| Parameter | Specification |
|---|---|
| Peak/pulse current | No separate pulsed-current limit is listed; ±32 mA is the stated operating envelope |
| Operating temperature | 0 to +55 °C |
| Storage temperature | -20 to +70 °C |
| Operating systems | Windows and Linux |
| Driver interface | VISA-based DLL |
Detailed performance and interface tables (3)
| Range | Resolution | Typical noise | Accuracy at 23 °C ± 5 °C |
|---|---|---|---|
| 5 V | 80 µV | 80 µV | ±(0.02% + 400 µV) |
| 10 V | 160 µV | 160 µV | ±(0.02% + 800 µV) |
| 15 V | 240 µV | 240 µV | ±(0.02% + 1.2 mV) |
| Range | Resolution | Typical noise | Accuracy at 23 °C ± 5 °C |
|---|---|---|---|
| 5 µA | 80 pA | 80 pA | ±(0.04% + 400 pA) |
| 40 µA | 640 pA | 640 pA | ±(0.04% + 3.2 nA) |
| 200 µA | 3.2 nA | 3.2 nA | ±(0.04% + 16 nA) |
| 2 mA | 32 nA | 32 nA | ±(0.04% + 160 nA) |
| 32 mA | 800 nA | 800 nA | ±(0.04% + 4 µA) |
| Slot supply | Current requirement |
|---|---|
| +3.3 V rail | 4 A |
| +5 V rail | 0 A |
| +12 V rail | 5 A |
| -12 V rail | 0 A |
- Typical voltage noise is specified peak-to-peak from 0.1 Hz to 10 Hz. Accuracy is expressed as a percentage of reading plus the stated offset.
- Typical current noise is specified peak-to-peak from 0.1 Hz to 10 Hz.
Specifications are subject to change without notice.
Models, Configuration & Compatibility
XMU-5921
Control interfaces and software
The module uses a PXIe bus and supports Windows and Linux through a VISA-based DLL for host integration and secondary software development.
PXIe · VISA DLL · Windows · Linux
Order codes and configuration are confirmed in the quotation.
Technical Resources
Selection guidance
Format: 3U PXIe, 78-pin D-Sub
Coverage: 32 channels; ±15 V and ±32 mA operating envelope; 1 MSa/s sampling; current resolution down to 80 pA
Best for: Synchronized high-density semiconductor, sensor, LED/LD, and battery characterization.
Compare products in the Source Measure Units categoryInformation for your quotation
XMU-5921 system configuration covers chassis compatibility, breakout or fixture wiring, channel assignment, guarding, and calibration requirements.


