Source Measure Units
XMU-5422 Four-Channel High-Precision Source Measure Unit
Four-quadrant PXIe source/measure with 20 µV voltage resolution.
Four channels within a ±24 V and ±150 mA envelope, with current resolution down to 10 pA on the 10 µA range.
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- Voltage range
- ±24 V
- Current range
- 10 µA / 100 µA / 1 mA / 10 mA / 150 mA
- Current sensitivity
- Down to 10 pA
- Sampling
- 600 kSa/s
Overview
XMU-5422 provides four source-and-measure channels with four-quadrant operation and 600 kSa/s sampling. Its ±24 V voltage range has 20 µV resolution; the 10 µA current range provides 10 pA programming and measurement resolution. The voltage/current envelope is shared with XMU-5421, with finer resolution and different accuracy limits.
Additional product details
The XMU-5422 provides four source-and-measure channels with four-quadrant operation in one 3U, 4 HP PXIe module. The XMU-5422 ±24 V voltage range combines with 20 µV resolution for precision device characterization, and its 10 µA current range provides 10 pA programming and measurement resolution. The XMU-5422 600 kSa/s sampling rate supports automated characterization and transient-oriented test workflows, and Windows and Linux support with a VISA-based DLL integrates the module into modular test systems.
XMU-5422 application areas also cover measurement support for power-electronic devices and power-supply design, multi-channel electrical characterization for semiconductor research workflows, and source and measurement functions for materials and biochemical research. The XMU-5422 was sold as XMU5201A until the 19 August 2026 renumbering, with the hardware unchanged.
Key Capabilities & Applications
Four-quadrant device testing
Four channels support sourcing, measurement and electronic-load workflows within a ±24 V and ±150 mA envelope. No separate higher pulsed-current limit is listed.
Fine range and accuracy selection
Voltage resolution is 20 µV with ±(0.015% + 1.2 mV) accuracy at 23 °C ±5 °C. The 10 µA current range resolves 10 pA with ±(0.025% + 1.5 nA) accuracy at the same temperature.
PXIe automated characterization
The 3U, 4 HP PXIe module specifies 600 kSa/s sampling and supports Windows and Linux through a VISA-based DLL.
Common applications
- Semiconductor test
- LED and LD test
- Aerospace electronics
- Power electronics
- Semiconductor research
- Materials and biochemical research
Applications and test requirements
Semiconductor test
Precision source and measurement functions for semiconductor devices and electronic components.
LED and LD test
Electrical test of LEDs, laser diodes, and other optoelectronic devices.
Aerospace electronics
Power electronics
Semiconductor research
Materials and biochemical research
Technical Specifications
| Parameter | Specification |
|---|---|
| Channels | 4 |
| Operation | Four-quadrant source/measure |
| Voltage range | ±24 V |
| Current range | 10 µA / 100 µA / 1 mA / 10 mA / 150 mA |
| Voltage resolution | 20 µV |
| Current sensitivity | Down to 10 pA |
| Sampling | 600 kSa/s |
| Peak/pulse current | No separate pulsed-current limit is listed; ±150 mA is the stated maximum current range |
View all 12 specifications
| Parameter | Specification |
|---|---|
| Operating temperature | 0 to +55 °C |
| Storage temperature | -20 to +70 °C |
| Operating systems | Windows and Linux |
| Driver interface | VISA-based DLL |
Detailed performance and interface tables (3)
| Voltage range | Resolution | Typical noise (0.1 Hz to 10 Hz) | Accuracy at 23 °C ± 5 °C |
|---|---|---|---|
| ±24 V | 20 µV | 20 µV peak-to-peak | ±(0.015% + 1.2 mV) |
| Current range | Resolution | Typical noise (peak-to-peak, 0.1 Hz to 10 Hz) | Accuracy at 23 °C ± 5 °C |
|---|---|---|---|
| 10 µA | 10 pA | 10 pA | ±(0.025% + 1.5 nA) |
| 100 µA | 100 pA | 100 pA | ±(0.025% + 15 nA) |
| 1 mA | 1 nA | 1 nA | ±(0.025% + 150 nA) |
| 10 mA | 10 nA | 10 nA | ±(0.025% + 1.5 µA) |
| 150 mA | 150 nA | 150 nA | ±(0.025% + 24 µA) |
| Slot supply | Current requirement |
|---|---|
| +3.3 V rail | 2 A |
| +5 V rail | 0 A |
| +12 V rail | 2.5 A |
| -12 V rail | 0 A |
Performance notes
On the XMU-5422, gate and junction leakage, photodiode dark current and insulation resistance read near the bottom of the 10 µA range. That range programs and measures in 10 pA steps, with ±(0.025% + 1.5 nA) accuracy at 23 °C ± 5 °C. The 1.5 nA offset, not the percentage term, is what a leakage figure really rests on. The next range up, 100 µA, resolves 100 pA instead. On the voltage side, 20 µV steps pair with ±(0.015% + 1.2 mV) over the ±24 V span. The 1.2 mV offset still rules at low set points, so what improves is bias repeatability.
At 10 pA the fixture usually sets the floor before the module does. Guard the low lead, keep cable movement out of the run and let the device settle. Noise is quoted peak-to-peak from 0.1 Hz to 10 Hz, which is drift, not bandwidth. Accept the unit against the 10 µA range with the input open and guarded.
Specifications are subject to change without notice.
Models, Configuration & Compatibility
XMU-5422
Control interfaces and software
The module uses a PXIe bus and supports Windows and Linux through a VISA-based DLL for host integration and secondary software development.
PXIe · VISA DLL · Windows · Linux
Order codes and configuration are confirmed in the quotation.
Technical Resources
Selection guidance
Format: 3U PXIe, 4 HP
Coverage: 4 channels; ±24 V voltage range; ±150 mA maximum current range; 600 kSa/s sampling; current resolution down to 10 pA
Best for: Four-channel low-current characterization requiring the highest precision among these models.
Step up to the XMU-5422 when the leakage is the measurement, not an error term. Nothing in the envelope changes against the XMU-5421; only the fine grade does.
Send the operating envelope, configuration and acceptance evidence you need; the quotation confirms model, options and delivery documentation.


