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Source Measure Units

XMU-5422 Four-Channel High-Precision Source Measure Unit

Four-quadrant PXIe source/measure with 20 µV voltage resolution.

Four channels within a ±24 V and ±150 mA envelope, with current resolution down to 10 pA on the 10 µA range.

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XMU-5422 Four-Channel High-Precision Source Measure Unit
Voltage range
±24 V
Current range
10 µA / 100 µA / 1 mA / 10 mA / 150 mA
Current sensitivity
Down to 10 pA
Sampling
600 kSa/s

Overview

XMU-5422 provides four source-and-measure channels with four-quadrant operation and 600 kSa/s sampling. Its ±24 V voltage range has 20 µV resolution; the 10 µA current range provides 10 pA programming and measurement resolution. The voltage/current envelope is shared with XMU-5421, with finer resolution and different accuracy limits.

Additional product details

The XMU-5422 provides four source-and-measure channels with four-quadrant operation in one 3U, 4 HP PXIe module. The XMU-5422 ±24 V voltage range combines with 20 µV resolution for precision device characterization, and its 10 µA current range provides 10 pA programming and measurement resolution. The XMU-5422 600 kSa/s sampling rate supports automated characterization and transient-oriented test workflows, and Windows and Linux support with a VISA-based DLL integrates the module into modular test systems.

XMU-5422 application areas also cover measurement support for power-electronic devices and power-supply design, multi-channel electrical characterization for semiconductor research workflows, and source and measurement functions for materials and biochemical research. The XMU-5422 was sold as XMU5201A until the 19 August 2026 renumbering, with the hardware unchanged.

Key Capabilities & Applications

Four-quadrant device testing

Four channels support sourcing, measurement and electronic-load workflows within a ±24 V and ±150 mA envelope. No separate higher pulsed-current limit is listed.

Fine range and accuracy selection

Voltage resolution is 20 µV with ±(0.015% + 1.2 mV) accuracy at 23 °C ±5 °C. The 10 µA current range resolves 10 pA with ±(0.025% + 1.5 nA) accuracy at the same temperature.

PXIe automated characterization

The 3U, 4 HP PXIe module specifies 600 kSa/s sampling and supports Windows and Linux through a VISA-based DLL.

Common applications

  • Semiconductor test
  • LED and LD test
  • Aerospace electronics
  • Power electronics
  • Semiconductor research
  • Materials and biochemical research
Applications and test requirements

Semiconductor test

Precision source and measurement functions for semiconductor devices and electronic components.

LED and LD test

Electrical test of LEDs, laser diodes, and other optoelectronic devices.

Aerospace electronics

Power electronics

Semiconductor research

Materials and biochemical research

Technical Specifications

ParameterSpecification
Channels4
OperationFour-quadrant source/measure
Voltage range±24 V
Current range10 µA / 100 µA / 1 mA / 10 mA / 150 mA
Voltage resolution20 µV
Current sensitivityDown to 10 pA
Sampling600 kSa/s
Peak/pulse currentNo separate pulsed-current limit is listed; ±150 mA is the stated maximum current range
View all 12 specifications
ParameterSpecification
Operating temperature0 to +55 °C
Storage temperature-20 to +70 °C
Operating systemsWindows and Linux
Driver interfaceVISA-based DLL
Detailed performance and interface tables (3)
Voltage programming and measurement
Voltage rangeResolutionTypical noise (0.1 Hz to 10 Hz)Accuracy at 23 °C ± 5 °C
±24 V20 µV20 µV peak-to-peak±(0.015% + 1.2 mV)
Current programming and measurement
Current rangeResolutionTypical noise (peak-to-peak, 0.1 Hz to 10 Hz)Accuracy at 23 °C ± 5 °C
10 µA10 pA10 pA±(0.025% + 1.5 nA)
100 µA100 pA100 pA±(0.025% + 15 nA)
1 mA1 nA1 nA±(0.025% + 150 nA)
10 mA10 nA10 nA±(0.025% + 1.5 µA)
150 mA150 nA150 nA±(0.025% + 24 µA)
PXIe slot power requirements
Slot supplyCurrent requirement
+3.3 V rail2 A
+5 V rail0 A
+12 V rail2.5 A
-12 V rail0 A
Performance notes

On the XMU-5422, gate and junction leakage, photodiode dark current and insulation resistance read near the bottom of the 10 µA range. That range programs and measures in 10 pA steps, with ±(0.025% + 1.5 nA) accuracy at 23 °C ± 5 °C. The 1.5 nA offset, not the percentage term, is what a leakage figure really rests on. The next range up, 100 µA, resolves 100 pA instead. On the voltage side, 20 µV steps pair with ±(0.015% + 1.2 mV) over the ±24 V span. The 1.2 mV offset still rules at low set points, so what improves is bias repeatability.

At 10 pA the fixture usually sets the floor before the module does. Guard the low lead, keep cable movement out of the run and let the device settle. Noise is quoted peak-to-peak from 0.1 Hz to 10 Hz, which is drift, not bandwidth. Accept the unit against the 10 µA range with the input open and guarded.

Specifications are subject to change without notice.

Models, Configuration & Compatibility

XMU-5422

Control interfaces and software

The module uses a PXIe bus and supports Windows and Linux through a VISA-based DLL for host integration and secondary software development.

PXIe · VISA DLL · Windows · Linux

Order codes and configuration are confirmed in the quotation.

Technical Resources

Download Datasheet

PDF technical specifications

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Selection guidance

Format: 3U PXIe, 4 HP

Coverage: 4 channels; ±24 V voltage range; ±150 mA maximum current range; 600 kSa/s sampling; current resolution down to 10 pA

Best for: Four-channel low-current characterization requiring the highest precision among these models.

Step up to the XMU-5422 when the leakage is the measurement, not an error term. Nothing in the envelope changes against the XMU-5421; only the fine grade does.

Compare products in the Source Measure Units category

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